Nec Corporation

Jiro Abe

Yoshimasa Ono

Junichi Abe

Akira Tsuji

Shigeo Suzuki

Hiroshi Matsumoto

Kazumine Ogura

Tatsuya Sumiya

Taisuke Tanabe

Takanori Shigeta

Yuya Matsumoto

An imaging condition determination system according to the present disclosure includes: a reference data holding unit () configured to hold reference data representing a position of an object; an indication object holding unit () configured to hold an indication object representing a position of a target object on the reference data; an imaging condition determination unit () configured to determine an imaging condition of LiDAR for imaging the target object based on the reference data and the indication object; and an imaging condition output unit () configured to output the imaging condition.

Imaging condition determination method, imaging condition determination system, imaging condition determination device, and computer readable medium

An information processing apparatus according to the present disclosure includes: at least one memory configured to store instructions; and at least one processor configured to execute the instructions to: generate, for each of a plurality of virtual cameras in a three-dimensional space, a virtual camera image shot by the respective one of the virtual cameras on the basis of point cloud data of the three-dimensional space; and estimate, on the basis of similarity between the virtual camera image generated by having the processor execute the generation instruction and a camera image shot by a camera, location and orientation of the camera when it shot the camera image.

Information processing apparatus, information processing method, and program

A measurement apparatus according to the present disclosure includes a position specifying unit configured to specify, using an apparatus reference coordinate system having a position of the measurement apparatus set as a reference, a position of each of a plurality of other measurement apparatuses; a candidate specifying unit configured to extract at least three measurement apparatuses out of the measurement apparatus and the plurality of the other measurement apparatuses and to specify, based on the positions of the extracted measurement apparatuses, a candidate region that serves as a candidate of a common region referred to in performing alignment of data captured by the measurement apparatus and the plurality of the other measurement apparatuses; and a common region determining unit configured to determine the common region based on the distribution of the plurality of the candidate regions obtained by changing combinations of the measurement apparatuses to be extracted.

Measurement apparatus, information processing apparatus, data specifying method, and non-transitory computer-readable medium

A detection device () according to the present disclosure includes an acquisition unit () that acquires point cloud data indicating a distance from a measurement device to an object and luminance information obtained from reflected light of a beam emitted when the point cloud data is measured, an edge detection unit () that performs edge detection based on the luminance information, and a crack determination unit () that determines whether an area indicates a crack by using a shape of the area in which, of a plurality of points indicated by the point cloud data, points having luminance within a predetermined range of difference from luminance of a point detected as an edge are distributed.

Detection device, determination method, and non-transitory computer-readable medium

A measurement device acquires first point cloud data at a first measurement position and second point cloud data at a second measurement position; determines a rotation axis for positional adjustment; determines, based on the rotation axis, the first point cloud data, and the second point cloud data, an evaluation function indicating a region that is a union set of one or more columnar bodies as an evaluation function representing desirability of a positional adjustment result; and calculates a positional adjustment parameter that optimizes the evaluation function based on the rotation axis, the first point cloud data, and the second point cloud data.

Measurement device, information processing device, position adjustment method, and computer-readable medium

A display device () according to the present disclosure includes: a detection unit () that detects, in a three-dimensional space including measurement point group data measured by a three-dimensional optical sensor, intermediate point group data of an intermediate region from a viewpoint for two-dimensionally displaying the measurement point group data to target point group data within the measurement point group data; a setting unit () that sets, based on the detected intermediate point group data, a display aspect of the measurement point group data or the target point group data in such a way that the target point group data become visually recognizable from the viewpoint; and a display unit () that two-dimensionally displays the measurement point group data and the target point group data according to the set display aspect.

Display device, display method, and non-transitory computer-readable medium having program stored therein

An abnormal part display apparatus, an abnormal part display system, an abnormal part displaying method, and an abnormal part displaying program capable of improving visibility of an abnormal part in an object are provided. An abnormal part display apparatusaccording to the present disclosure includes an acquisition unitconfigured to acquire point group data of an object obtained by measuring the object by using a laser ranging apparatus, and a photograph image of the object obtained by photographing the object by using a photographing apparatus, a display unitconfigured to display the point group data and the photograph image on a predetermined screen, and a control unitconfigured to control the point group data and the photograph image to be displayed in the display unit

Growing community of inventors

Tokyo, Japan

Jiro Abe