Samsung Electronics Co., Ltd.

Sungkyunkwan University

Samsung Electro-Mechanics Co., Ltd.

Jinyong Kim

Wookrae Kim

Jaehoon Jeong

Sungho Jang

Jinseob Kim

Daehoon Han

Youngsik Hur

Hangil Moon

Joonrae Cho

Kyoungho Bang

Junghyeon Kim

Myungjun Lee

Jaeseong Lee

Jaehwang Jung

Garam Choi

Wonsun Hwang

Igor Ivanov

Sungwook Kang

Byeongmin Lee

Hyunjin Yoo

Suyeon Han

Hyung Goo Lee

Kangta Jo

Younguk Jin

A semiconductor measurement apparatus includes an illumination unit including a light source and at least one illumination polarization element, a light receiving unit including at least one light-receiving polarization element disposed on a path of light reflected by a sample, and an image sensor positioned to receive light passing through the at least one light-receiving polarization element and configured to output an original image, and a control unit configured to determine, by processing the original image, a selected critical dimension among critical dimensions of a structure included in a region of the sample. The control unit is configured to obtain a plurality of sample images by selecting regions of the original image in which a peak due to interference appears, to determine a plurality of elements included in a Mueller matrix using the plurality of sample images, and to determine the selected critical dimension based on the plurality of elements.

Semiconductor measurement apparatus

A semiconductor measurement apparatus may include an illumination unit configured to irradiate light to the sample, an image sensor configured to receive light reflected from the sample and output multiple interference images representing interference patterns of polarization components of light, an optical unit in a path through which the image sensor receives light and including an objective lens above the sample, and a control unit configured to obtain, by processing the multi-interference image, measurement parameters determined from the polarization components at each of a plurality of azimuth angles defined on a plane perpendicular to a path of light incident to the image sensor. The control unit may be configured to determine a selected critical dimension to be measured from a structure in the sample based on measurement parameters. The illumination unit and/or the optical unit may include a polarizer and a compensator having a ¼ wave plate.

A semiconductor measurement device may include an illumination apparatus having a polarizer on a propagation path of light output from a light source; an optical assembly including an objective lens configured to allow light passing through the polarizer to be incident on a sample and a beam splitter configured to transmit light reflected from the sample to first and second sensors; and a controller. The controller may be configured to determine an alignment state of patterns in a first region of the sample using a first original image output by the first sensor and an alignment state of patterns in a second region of the sample using a second original image output by the second sensor. The first sensor includes a first image sensor and a self-interference generator in a path along which light is incident on the first image sensor. The second sensor includes a second image sensor.

An electronic device according to various embodiments disclosed herein may include: a housing, a speaker embedded in the housing, an acoustic duct configured to transfer an output from the speaker to a user, an external hole formed in the housing to be connected to outside the electronic device, an external sound duct configured to transfer a sound introduced through the external hole to the user, and a variable hole member comprising a variable opening disposed in at least one of the external hole and the external sound duct, wherein the variable hole member may include a conductive member comprising a conductive material configured to apply an electric signal, a ventilation hole configured to allow a sound transferred from the external hole to pass therethrough, and a deformable member comprising a deformable material configured to deform based on the electric signal to close at least a portion of the ventilation hole.

Electronic device including opening and closing structure

The present disclosure provides a system and method of providing a security service by means of a network operator management system in a security management system, the method including receiving a high-level first security policy from an I2NSF (interface to Network Security Functions) user; receiving an available security service from a developer's management system; creating a low-level second security policy corresponding to the first security policy on the basis of the security service; and transmitting a packet including the second security policy for setting the created second security policy to each of a plurality of NSFs (Network Security Function) to an NSF instance, wherein the network operator management system and the NSFs are respectively connect to an I2NSF NSF-laving interface, and the second security policy includes at least one or more of 1) blocking SNS access during business hours, 2) blocking a malicious VoIP (Voice over Internet Protocol) or a malicious VoCN (Voice over Cellular Network) packet, or 3) mitigating flood of http and https for a company web server.

I2NSF network security function facing interface YANG data model

A power amplifier, a power amplifier system, and an operating method thereof are provided. The power amplifier system may include a power amplifier, a power amplifier controller, and a voltage generator. The power amplifier may include a plurality of power transistor cells each of which receives an RF signal through a control terminal thereof to amplify the RF signal. The power amplifier controller may control turn-on and turn-off operations of at least one power transistor cell among the plurality of power transistor cells based on a power mode. The voltage generator may generate a power supply voltage supplied to first terminals of the power transistor cells and may change the power supply voltage depending on the power mode.

Power amplifier, power amplifier system and operating method thereof

The present disclosure is a method for managing capabilities of network security functions (NSF) by a security controller in a security management system.

I2NSF capability YANG data model

Growing community of inventors

Suwon-si, South Korea

Jinyong Kim