Smart Modular Technologies, Inc.

Jinying Shen

Robert Tower Frey

Kelvin Alberto Marino

Amir Alavi

Rajesh Ananthanarayanan

Joshua Harris Brooks

Approaches, techniques, and mechanisms are disclosed for a centralized backup power support system that improves testability of non-volatile dual in-line memory modules (NVDIMM) on Automatic Test Equipment (ATE) testers and in-system tests. An NVDIMM includes both volatile memories and non-volatile memories. According to an embodiment, a compact backup power distribution board is powered with an external power supply with an individual protection circuit. The backup power distribution board has an unlimited energy capacity for any density of NVDIMM and zero charge waiting time. According to an embodiment, instead of using an electric double-layer capacitor (EDLC) to support backup power, a resistor is used instead of an EDLC on each backup power module. There is no charging time when the backup power module does not have EDLC cells, resulting in significant reduction in test time and production cost and increase in production output.

Centralized backup power module

Approaches, techniques, and mechanisms are disclosed for a test adapter designed to improve testability of non-volatile dual in-line memory modules (NVDIMM) on automatic test equipment (ATE) testers or in-system boards, which have inadequate power supplies. An NVDIMM includes both volatile memories and non-volatile memories. A test adapter is designed to supply increased power to an NVDIMM. A test adapter is implemented using an interposer or a printed circuit board (PCB) that may be inserted into a socket on an ATE tester or on an end-user system-level board. The interposer or PCB includes a power socket for attaching a power cable to supply the external power supply to the NVDIMM. A power on/off sequence is controlled by an ATE tester to simulate or test a system power on/off sequence. An external input power is always on, but both serial and backup power signals are only on during tests of an NVDIMM.

Memory module test adapter

Approaches, techniques, and mechanisms are disclosed for improving the performance of memory controllers for memory devices. A system may have a memory controller that interfaces with a memory device to store or retrieve information. When the system needs to retrieve information from the memory device, the memory controller sends an address and a command to instruct the memory device to read the information stored at the address. The memory device reads the information, and after a specific amount of time, the memory device sends the information to the memory controller. According to an embodiment, 'dummy' data is sent first prior to the availability of the data read out of the memory devices, while waiting for the requested data to be accessed, and then the actual data is sent immediately following the dummy data. According to an embodiment, a geometry of a memory device has only one column of memory cells that are used to store information. The memory device with only one column in an embodiment does not require decoding of a column address. As such, the read latency of the memory device is significantly reduced.

Memory controller for high latency memory devices

An integrated circuit system, and a method of operation thereof, including: a memory unit having a volatile memory device with data and a non-volatile controller unit; a memory unit controller of the non-volatile controller unit for receiving a snoop signal for indicating an error; a non-volatile device of the memory unit for synchronously receiving data of the volatile memory device based on the snoop signal, the data autonomously copied without any intervention from outside the memory unit to prevent loss of the data; and an in-band command received by the memory unit, for autonomously restoring the data to the volatile memory device from the non-volatile device without any intervention from outside the memory unit.

Computing system with backup and recovery mechanism and method of operation thereof

A method of manufacture of the memory management system includes: fabricating a dual in-line memory module carrier; mounting a volatile memory device on the dual in-line memory module carrier; mounting a non-volatile memory on the dual in-line memory module carrier on a side opposite the volatile memory device; mounting an uninterruptible power supply on the dual in-line memory module carrier for maintaining a memory module power when a system power input decays; and mounting a controller logic integrated circuit on the dual in-line memory module carrier coupled to the volatile memory device, the non-volatile memory, and the uninterruptible power supply for copying data content of the volatile memory device to the non-volatile memory when the uninterruptible power supply detects the decay of the system power input to a first cross-over level.

Growing community of inventors

San Ramon, CA, United States of America

Jinying Shen