Samsung Electronics Co., Ltd.

Jinsu Jung

Jaehyun Kim

Seongmin Jo

Heeseong Lee

Hak-soo Yu

Jaeyoun Youn

Chulwoo Park

Sung Hyun Lee

Jun Hee Yoo

Hyojin Choi

Sua Kim

Dongsoo Kang

A Network-on-Chip (NoC) includes a packet transmission switch, and a corresponding method of operating the NoC includes storing packets received from an input terminal in a buffer, storing buffer locations in which each of the packets is stored in an ordering queue of an output terminal, and sequentially outputting the packets from the output terminal according to the buffer locations.

Switch for transmitting packet, network on chip having the same, and operating method thereof

A test method of the semiconductor memory device including a memory cell array and an anti-fuse array includes detecting failed cells included in the memory cell array; determining a fail address corresponding to the detected failed cells; storing the determined fail address in a first region of the memory cell array; and reading the fail address stored in the first region to program the read fail address in the anti-fuse array. According to the test method of a semiconductor memory device and the semiconductor memory system, since the test operation can be performed without an additional memory for storing an address, the semiconductor memory device and the test circuit can be embodied by a small area.

Test method of semiconductor memory device and semiconductor memory system transferring fail address data from a volatile to a non-volatile memory array using an error-correction code engine

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Suwon-si, South Korea

Jinsu Jung