Boe Technology Group Co., Ltd.

Beijing Boe Display Technology Co., Ltd.

Jinqian Wang

Kuanjun Peng

Fangzhen Zhang

Wei Wang

Dan Wang

Wei Qin

Xiaolong Li

Tieshi Wang

Chunfang Zhang

Xueling Gao

Lu Wang

Jintao Peng

Shuang Sun

Jinyu Ren

Shengnan Li

Yujun Zhang

Guojing Ma

Sha Feng

Haisheng Liu

Miaomiao Yang

The present disclosure provides a shift register unit, a gate driver circuit, and a display device, belonging to the field of display technology, which can solve the problem of unstable threshold voltage and current leakage of thin film transistors in existing shift register units. The shift register unit in the present disclosure includes: an input subcircuit, an output subcircuit, a pull-down control subcircuit, a pull-down subcircuit, a first noise reduction subcircuit, a first auxiliary control subcircuit, and a second auxiliary control subcircuit. The first auxiliary control subcircuit is configured to write the third reference level signal to the pull-down control node when the pull-down node is the first reference level signal, and control the pull-down subcircuit to be closed to control the first noise reduction subcircuit to be open.

Shift register units, gate driver circuits, and display devices

A semi-transparent semi-retroreflective film and an air display device are provided. The air display device includes: a first polarizer and a second polarizer assembled with each other to form a cell; a semi-transparent semi-reflective structure and a semi-transparent semi-retroreflective film disposed between the first polarizer and the second polarizer; a first &#xbc; wave plate disposed at a side of the air display device adjacent to the first polarizer; and a second &#xbc; wave plate disposed between the semi-transparent semi-reflective structure and the semi-transparent semi-retroreflective film. The air display device is configured such that polarized light incident from the first polarizer, after being processed by an internal optical path of the air display device, exits from the second polarizer to form an air image at a side of the air display device away from the first polarizer.

Semi-transparent semi-retroreflective film and air display device

A display panel and deformation sensing method thereof, and a display device are provided. The display panel includes a substrate, and a deformation sensing unit on the substrate; the deformation sensing unit includes a first electrode, a second electrode, and a third electrode, the second electrode and the third electrode being configured to form a first capacitor, the first electrode and the second electrode being configured to form a second capacitor, the first electrode and the third electrode being configured to form a third capacitor, and the first capacitor, the second capacitor, and the third capacitor being configured to determine a shape-state of the display panel.

Display panel and deformation sensing method thereof, and display device

The present disclosure relates to display technology field, particularly to a compensation sub-pixel unit, a method of fabricating the compensation sub-pixel unit, a method of driving the compensation sub-pixel unit, a pixel structure and a display panel. The compensation sub-pixel unit includes a piezoelectric film. The compensation sub-pixel unit includes a switching transistor that has a control end connected to the piezoelectric film layer, and a first end connected to a data voltage signal end. The compensation sub-pixel unit includes a driving transistor that has a control end connected to a gate voltage signal end, a first end connected to a second end of the switching transistor, and a second end connected to a power signal end.

Compensation sub-pixel unit, methods of fabricating and driving the same, and pixel structure and display panel using the same

A device for film thickness measurement and a method for film thickness measurement are disclosed. The device includes a planar indenter, a collecting unit and a processing unit. The planar indenter includes a base plate and a piezoelectric film layer. The collecting unit includes a plurality of collecting circuits evenly distributed above the piezoelectric film layer and spaced from each other. The collecting circuits are used for collecting current signals generated when the piezoelectric film layer deforms at positions corresponding to the collecting circuits. The processing unit is used for calculating a film thickness of the film sample to be measured based on the current signals collected by each of the collecting circuits.

Device for film thickness measurement and method for film thickness measurement

Growing community of inventors

Beijing, China

Jinqian Wang