Shenzhen China Star Optoelectronics Technology Co., Ltd.

Jingming Wu

Li Wei Wang

Rui Xu

Weiwei Zhang

Xiaobo He

Honghui Zhu

Hongqing Huang

Hui Zhou

Mingfeng Deng

Songxian Wen

Yizhuang Zhuang

Jungmao Tsai

Xueli Ao

A cleaning equipment of sample bottle for chromatography analysis comprising: a base; a support frame vertically fixed to the base; a horizontal column having two ends, wherein one of the ends is disposed at the support frame through an adjustment knob; a rotary drive device fixed to the other end of the horizontal columns; a rotation disk which can rotate through driving of the rotary drive device, and a side edge of the rotation disk provides with multiple placing holes for receiving and fixing sample bottles; a cleaning agent recycling tank disposed below the rotation disk, wherein a side wall of it provides with an ejector pipe connected with a water pump; and a control unit for controlling on/off and rotation speed of the rotary drive device, and on/off of the water pump. The invention also provides a cleaning method of sample bottle for chromatography analysis.

Cleaning equipment of sample bottle for chromatography analysis and cleaning method thereof

The present application relates to a colorimeter measurement method and a colorimeter for implementing the method. The method includes the following steps: placing a measured sample on a sample platform; shooting a current image of the sample; determining an intersection angle &#x3b8; between the sample and a moving direction of the sample platform; adjusting a position of a scanning light spot of a colorimeter according to the angle &#x3b8;, so that the sample coincides with the moving direction of the sample platform; using the colorimeter to scan the measured sample. By implementing the colorimeter measurement method and the colorimeter of the present application, the sample can be placed optionally when it is measured. Specially, when a design value of a measured sample is approximately equal to a size of the measuring light spot, much time can be saved and manpower waste is avoided.

Colorimeter measurement method and colorimeter for implementing the method

The present invention provides a potentiometric titration method for measuring concentration of acid mixture of aluminum etchant, which prepares identified potassium hydroxide-ethanol solution or sodium hydroxide-ethanol solution as a titrant and uses a monohydric alcohol and a diol as an anhydrous medium for the acid mixture of aluminum etchant to carry out titration of the acid mixture of aluminum etchant so as to realize measurement of concentration of each acid contained in the acid mixture of aluminum etchant through a one-stage process of potentiometric titration thereby reducing the complication of operation of inspection and uncertainty of inspection result and achieving the purposes of carrying out inspections with high precision and high performance. The method can efficiently and accurately measure the concentrations of nitric acid, phosphoric acid, and acetic acid contained in the acid mixture of aluminum etchant.

Potentiometric titration method for measuring concentration of acid mixture of aluminum etchant

The present invention discloses a backlight module and an LCD device, comprising: a backplane and an LGP; the edge(s) of the LGP is provided with lug boss(es), each lug boss is provided with a positioning hole, and the backplane is provided with rivet(s) for matching with the positioning hole; a buffer structure is arranged between the rivet and the wall of the positioning hole. In the present invention, because the edge(s) of the LGP is provided with lug boss(es), each lug boss is provided with a positioning hole, the arrangement of the positioning hole does not influence the light guide area of the LGP; meanwhile, because a layer of buffer structure is arranged between the positioning hole and the rivet, the rupture of the part with concentrated stress in the positioning hole during collision is avoided. In addition, when the LGP is expanded with heat, the buffer structure can also avoid the extrusion damage caused by direct extrusion between the LGP and the rivet; when the LGP is contracted with cold, the gap between the LGP and the rivet is increased so that shake is easily caused. The gap between the LGP and the rivet is automatically filled by a buffer part through the elastic regulation of the buffer part. Thus, the shake collision of the LGP is avoided.

Backlight module and LCD device

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Shenzhen, China

Jingming Wu