Inspur Suzhou Intelligent Technology Co., Ltd

Jingdong Zhang

Jiangwei Wang

Hongwei Kan

Lei Guo

Yaming Xu

A method and apparatus for performing a power stress test on an FPGA acceleration card and a computer-readable storage medium. The method includes: dividing, according to a partial reconfiguration method, a hardware resource of an FPGA acceleration card into a static region serving as a hardware logic implementation region for performing a normal function test, and a dynamic PR region including a blank mode occupying no hardware resource and a power test mode for performing a power stress test, and burning FPGA firmware having a partial reconfiguration function to a flash memory; upon receiving a request for power stress test, configuring an operation mode of the dynamic PR region to be the power test mode, loading, to the dynamic PR region, a dynamic PR configuration file burned in the flash memory; and calling a power stress test module to execute the power stress test in the dynamic PR region.

Method and apparatus for performing power stress test on FPGA acceleration card, and storage medium

Disclosed is an Avalon-to-Axi4 bus conversion method, including: in case that an Avalon bus is an Avalon_st bus, receiving Avalon_st bus data, performing a logical process on the received Avalon_st bus data, and then outputting corresponding Axi4_st bus data; and in case that the Avalon bus is an Avalon_mm bus, receiving a signal transmitted by each channel of the Avalon_mm bus, framing and storing the signal in asynchronous First Input First Output (FIFO), and in case that a device corresponding to an Axi4 bus is ready, reading the signal from the asynchronous FIFO, and outputting the signal to a corresponding channel of the Axi4 bus according to a timing relationship of the Axi4 bus.

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Jiangsu, China

Jingdong Zhang