Boe Technology Group Co., Ltd.

Beijing Boe Optoelectronics Technology Co., Ltd.

Boe Mled Technology Co., Ltd.

Huawei Technologies Co., Limited

Beijing Zhongxiangying Technology Co., Ltd.

Jing Xue

Yanyan Yin

Hongyan Xing

Ziwei Cui

Hao Wu

Yubing Song

Xue Dong

Haisheng Wang

Yingming Liu

Shengji Yang

Weijie Zhao

Lingyun Shi

Ming Jin Chen

Xiurong Wang

Guofeng Hu

Qibing Gu

Yue Gu

Xiaochuan Chen

Jian Wang

Lei Wang

Hong Wang

Wei Li

Yu Wang

Rui Li Xu

Jing Li

Tao Yang

Ruijun Dong

Hong Zhu

Yu Feng

Hong Liu

Chunlei Wang

Fan Zhang

Chen Meng

Liang Zhao

Donghui Wang

Jian Lin

Zhiyong Wang

Yong Song

Gang Zhang

Limin Zhang

Zhichao Yang

Zhilong Duan

Hongjun Yu

Yang You

Wei Hao

Yashuai An

Honggui Jin

Xianglei Qin

Lingfang Nie

Liangzhen Tang

Zepeng Sun

Chuan Wang

Tian Lan

Mingjian Yu

Jianmin Wu

Hongming Liu

Haijin Wang

Jianfeng Zeng

Bin Ma

Falong Han

Rui Xu

Shilong Liang

Jiawei Ren

Pijian Cheng

Mengjiao Liao

Xiaoyan Zhao

An array substrate and a method for forming the array substrate, a display panel and a display device are provided in the present disclosure. The array substrate includes: a base substrate, a first electrode layer, a first insulating layer and a second electrode layer arranged sequentially on the base substrate, a light-emitting element group located on the second electrode layer, where the light-emitting element group includes one or more light-emitting elements, each light-emitting element includes a first electrode, a light emitting layer and a second electrode, the first electrode is coupled to the first electrode layer, and the second electrode is coupled to the second electrode layer, so as to drive the light emitting layer to emit light.

Array substrate, method for forming the same, display panel and display device

The present disclosure provides a method for processing defect information of a product, which includes the following steps of: acquiring defect information on a current film layer and defect information on historical film layers; determining whether defect information exists at a target location of the historical film layer if defect information exists at a target location of the current film layer; if defect information exists for a corresponding location to the target location in at least one of the historical film layers, deleting the defect information detected at the target location in the current film layer; and if no defect information exists for the target location in any of the historical film layers, retaining the defect information detected at the target location in the current film layer. According to this, for the defect information on the current film layer, only the defect information caused by factors of the current film layer may be retained, and the defect information caused by the historical film layers will not be retained, and thus, on the one hand, the stored data volume may be reduced, and on the other hand, the complexity of subsequent analysis of defect information may be simplified.

Methods and devices for processing and retrieving defect information of product

A display panel and a driving method thereof, and a display device. The display panel includes a substrate and a plurality of pixel circuits arranged in an array on the substrate, each of the plurality of pixel circuits includes a pixel driving chip and at least one light-emitting element electrically connected to the pixel driving chip, and the pixel driving chip is configured to receive and store a data signal and drive the at least one light-emitting element to emit light according to the data signal.

Display panel and driving method thereof, and display device

Provided is a pixel structure, a display panel, and a display device. The pixel structure includes three sub-pixel units of different colors and a driving unit. The three sub-pixel units include a first sub-pixel unit, a second sub-pixel unit, and a third sub-pixel unit. The driving unit is configured to send corresponding display data to the three sub-pixel units respectively. The sub-pixel units are arranged on one side or two sides of the driving unit.

Pixel structure, display panel, and display device

A probe assembly is provided, which is applied to an electrical testing device. The probe assembly includes a probe body, which includes a testing end configured to contact with a to-be-tested device and a connection end opposite to the testing end; an elastic connection structure configured to be deformed when the probe body is subjected to a pressure; and a fixing base. The connection end is fixedly connected to the fixing base via the elastic connection structure. A testing device is further provided.

Probe assembly and testing device

An elastic support structure for a display module and a display device including the elastic support structure are provided. The elastic support structure includes a first support member and a second support member. A first angle is formed between the first support member and the second support member, and the first angle is variable, so as to enable the elastic support structure to provide elastic support. The elastic support structures are arranged at an identical interval between an outer frame of a back plate and an inner frame of a housing, so as to support the display module.

Elastic support structure and display device including the same

A pixel circuit and a driving method thereof, an array substrate including the pixel circuit and a display apparatus thereof are provided. The pixel circuit comprising a display driving sub-circuit () and a touch detection sub-circuit (), wherein the display driving sub-circuit () is configured to drive a display element to emit light under controls of the first scan line (SCAN), the second scan line (SCAN), the third scan line (SCAN), the data line (DATA) and the light emitting control line (EM); and the touch detection sub-circuit () is configured to detect a touch action and generate a sense signal under controls of the second scan line (SCAN), the third scan line (SCAN) and the data line (DATA). The effect due to variances in a threshold voltages of driving thin film transistors can be eliminated by compensation, and an integration of a touch function and an AMOLED is achieved.

Pixel circuit and driving method thereof, array substrate and display apparatus

The present disclosure provides an automatic needle insertion apparatus, including a frame, a bearing device on the frame and configured to bear thereon a body part into which a needle is to be inserted, an acquisition device on the frame and configured to acquire vascular information of the body part, a needle insertion device on the frame and configured to execute a needle insertion operation and a needle withdrawal operation on the body part, and a first control device connected to the needle insertion device and the acquisition device and configured to control an operating state of the needle insertion device in accordance with the vascular information acquired by the acquisition device.

Automatic needle insertion apparatus

The present disclosure relates to a display panel, a liquid crystal display device and a test method thereof. The display panel includes a display area and a GOA circuit area. The GOA circuit area includes a plurality of GOA units arranged on a TFT substrate and metal areas arranged at positions of a CF substrate corresponding to the GOA units, which constitute capacitor structures with the GOA units. The display panel further includes signal lines electrically connected with the capacitor structures and test points elicited through the signal lines. By means of the above configuration, the position where short circuit/open circuit occurs in the GOA circuit area can be found quickly by monitoring the voltage on the test point, thereby shortening the time of seeking ESD and short circuit/open circuit, increasing the analyzing and improving speed.

Display panel, touch panel, liquid crystal display device and test method thereof

The present disclosure provides a pixel driving circuit, a display substrate and a driving method thereof, and a display device. The pixel driving circuit includes a driving unit, a data voltage write unit, an energy storage unit, a threshold compensation unit, and a touch driving compensation unit. The energy storage unit comprises a first energy storage end and a second energy storage end. The touch driving compensation unit is connected to the second energy storage end of the energy storage unit to compensate the voltage of the second energy storage end in a touch phase, so as to maintain that driving current generated by the driving unit does not vary with time. The pixel driving circuit provided by the present disclosure can allow luminance of a driven electroluminescent element does not vary with time in a touch phase, thereby avoiding affecting light emission display of the driven electroluminescent element.

Pixel driving circuit, display substrate and driving method thereof, and display device

Embodiments of the present invention disclose an array substrate and a manufacturing method thereof, a display device, which relates to the display field, and can increase transmittance of the product, and also has improvement effect to defects such as crosstalk, flicker, etc. An embodiment of the present invention provides an array substrate, comprising: a substrate, a data line, a gate line, a thin film transistor and a pixel electrode formed on the substrate, the thin film transistor comprises a gate insulating layer, a part of the gate insulating layer corresponding to a light-transmissive area of a pixel is removed.

Array substrate and manufacturing method thereof, display device

A lighting jig for inspection of a liquid crystal panel, which includes: a base plate; a first supporting plate and a second supporting plate, which are respectively located on and orthogonal to the base plate; and an adsorption platform disposed between the first supporting plate and the second supporting plate and being able to move up and down along a direction orthogonal to the base plate. The adsorption platform has an adsorption surface for adsorbing probes, and the adsorption positions of the probes on the adsorption surface can be adjusted according to distributed locations of circuit test points of various liquid crystal panels to be inspected. The lighting jig provided by embodiments of the present invention can be used for lighting various types of liquid crystal panels, thereby improving the universality and use efficiency of the lighting jig.

Lighting jig for inspection of a liquid crystal panel

A method, an apparatus and an equipment of inspecting the quality of an LCD are provided, the method includes: obtaining optical parameters of the LCD; capturing images of the LCD; and determining that the LCD is defective after determining that the optical parameters are not in the range of the preset optical parameters and/or the captured images of the LCD are not consistent with the pre-stored images. Through the technical solution of the present invention, it can effectively differentiate the defect types of a product and record the defect position of the product, thereby it can effectively reduce misjudgment or miss test caused by the visual differences between operators to improve the quality and yield of manufactured LCD.

Method, apparatus and equipment of inspecting quality of LCD

A mask plate for manufacturing an organic light-emitting diode (OLED) transparent display panel, the OLED transparent display panel and a manufacturing method thereof are disclosed. The mask plate includes a substrate and a plurality of hollowed-out areas and a plurality of opaque areas disposed on the substrate, and a pattern of the hollowed-out areas correspond to a pattern of a cathode of the OLED transparent display panel to be manufactured; and all the hollowed-out areas are communicated with each other.

Mask plate, organic light-emitting diode (OLED) transparent display panel and manufacturing method thereof

A method for measuring a performance indicator of a service flow is disclosed. A sending-end device constructs a measurement packet. The measurement packet is used to trigger a receiving-end device to measure the performance indicator of the service flow. A forwarding attribute of the measurement packet is the same as a forwarding attribute of a packet in the service flow. The measurement packet is sent to the receiving-end device.

Method and sending-end device for measuring performance indicator of service flow

Growing community of inventors

Beijing, China

Jing Xue