Growing community of inventors

White Plains, NY, United States of America

Jing Sha

Average Co-Inventor Count = 3.41

ph-index = 4

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 52

Jing ShaDerren Neylon Dunn (11 patents)Jing ShaMichael A Guillorn (8 patents)Jing ShaDongbing Shao (7 patents)Jing ShaMartin Burkhardt (5 patents)Jing ShaEkmini Anuja De Silva (3 patents)Jing ShaSean David Burns (2 patents)Jing ShaLawrence Alfred Clevenger (1 patent)Jing ShaZheng Xu (1 patent)Jing ShaRobert C Wong (1 patent)Jing ShaNelson M Felix (1 patent)Jing ShaKafai Lai (1 patent)Jing ShaShyng-Tsong Chen (1 patent)Jing ShaHao Tang (1 patent)Jing ShaJinning Liu (1 patent)Jing ShaYufei Wu (1 patent)Jing ShaJing Sha (18 patents)Derren Neylon DunnDerren Neylon Dunn (23 patents)Michael A GuillornMichael A Guillorn (217 patents)Dongbing ShaoDongbing Shao (65 patents)Martin BurkhardtMartin Burkhardt (15 patents)Ekmini Anuja De SilvaEkmini Anuja De Silva (141 patents)Sean David BurnsSean David Burns (72 patents)Lawrence Alfred ClevengerLawrence Alfred Clevenger (644 patents)Zheng XuZheng Xu (182 patents)Robert C WongRobert C Wong (89 patents)Nelson M FelixNelson M Felix (78 patents)Kafai LaiKafai Lai (76 patents)Shyng-Tsong ChenShyng-Tsong Chen (59 patents)Hao TangHao Tang (26 patents)Jinning LiuJinning Liu (4 patents)Yufei WuYufei Wu (4 patents)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. International Business Machines Corporation (18 from 164,108 patents)


18 patents:

1. 11301748 - Automatic feature extraction from aerial images for test pattern sampling and pattern coverage inspection for lithography

2. 11189566 - Tight pitch via structures enabled by orthogonal and non-orthogonal merged vias

3. 10990747 - Automatic generation of via patterns with coordinate-based recurrent neural network (RNN)

4. 10831976 - Predicting local layout effects in circuit design patterns

5. 10768532 - Co-optimization of lithographic and etching processes with complementary post exposure bake by laser annealing

6. 10706205 - Detecting hotspots in physical design layout patterns utilizing hotspot detection model with data augmentation

7. 10706200 - Generative adversarial networks for generating physical design layout patterns of integrated multi-layers

8. 10699055 - Generative adversarial networks for generating physical design layout patterns

9. 10678971 - Space exploration with Bayesian inference

10. 10657420 - Modeling post-lithography stochastic critical dimension variation with multi-task neural networks

11. 10621302 - Classification and localization of hotspots in integrated physical design layouts

12. 10621301 - Coordinates-based variational autoencoder for generating synthetic via layout patterns

13. 10621295 - Incorporation of process variation contours in design rule and risk estimation aspects of design for manufacturability to increase fabrication yield

14. 10606975 - Coordinates-based generative adversarial networks for generating synthetic physical design layout patterns

15. 10599807 - Automatic generation of via patterns with coordinate-based recurrent neural network (RNN)

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12/3/2025
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