Samsung Electronics Co., Ltd.

Jindo Byun

Junghwan Choi

Youngdon Choi

Younghoon Son

Joohwan Kim

Hyungmin Jin

Junyoung Park

Hyunyoon Cho

Eunseok Shin

Jeongdon Ihm

Tongsung Kim

Youngmin Jo

Dongho Shin

Jungjune Park

Jinwook Lee

Minsu Jung

Seonkyoo Lee

Eun Seok Shin

HyunJin Kim

Hyun-Yoon Cho

Garam Kim

Youngdo Um

Hyeokjun Choi

Kwangseob Shin

A transmitter configured to receive first to N-th data in parallel and sequentially output the first to N-th data in response to first to N-th clock signals having different phases from each other, where N is an integer of at least 2, the transmitter including first to N-th data selectors including a first data selector and a second data selector in correspondence to the first to N-th data, each of the first to N-th data selectors being configured to perform a logical operation on one of the first to N-th data and the first to N-th clock signals and output a plurality of data selection signals, a first pre-driver in correspondence to at least two data selectors among the first to N-th data selectors, the first pre-driver being configured to receive the plurality of data selection signals from the at least two data selectors.

Transmitter, memory device and semiconductor device including the transmitter

Disclosed is a memory device which includes a pull-up driver that is connected between a power supply voltage and a first node, a T-coil circuit that is connected between the first node and a second node, an external resistor, and a ZQ controller that performs a ZQ calibration operation on the pull-up driver. The ZQ controller includes a path selecting circuit that selects one node among the first node and the second node, a comparing circuit that compares a voltage of the one node selected by the path selecting circuit with a pull-up reference voltage and outputs a comparison result, and a code generating circuit that generates a pull-up code for driving the pull-up driver, based on the comparison result. While the pull-up code is generated, the external resistor is connected between the second node and a ground voltage.

Memory device, electronic device, and operation method of memory device

A semiconductor device includes a phase splitter configured to output a plurality of clock signals having different phases by using a plurality of external clock signals having different phases, a plurality of code generators configured to receive a pair of selection clock signals determined from the plurality of clock signals and to output a phase code corresponding to a phase difference error between the pair of selection clock signals, and a delay circuit configured to at least partly simultaneously adjust at least two of a rising edge and a falling edge of each of the plurality of external clock signals with reference to the phase code during a lock time.

Semiconductor device

A memory system including: a memory controller to transmit a command, an address, or data to a first channel based on a data input/output signal having one of N (N is a natural number of three or more) different voltage levels during a first time interval, the memory controller transmitting the command, the address, or the data not transmitted during the first time interval to the first channel based on the data input/output signal having one of two different voltage levels during a second time interval; and a memory device to sample the data input/output signal received via the first channel during the first time interval in a pulse amplitude modulation (PAM)-N mode, the memory device sampling the data input/output signal received via the first channel during the second time interval in a non return to zero (NRZ) mode.

Memory device supporting a high-efficient input/output interface and a memory system including the memory device

A transmitter circuit that receives parallel signals and outputs a serial signal in response to the parallel signals may include; a clock generator generating first clock signals having different respective phases, a multiplexer including selection circuits respectively configured to selectively provide at least two of the parallel signals to an output node in response to at least two of the first clock signals, and an output driver generating the serial signal by amplifying a signal at the output node.

Transmitter circuit and method of operating same

A transmitter circuit includes a clock generator configured to generate a plurality of clock signals having different phases, and a plurality of selection circuits configured to receive a plurality of parallel data signals and output a serial data signal on an output node based on the plurality of clock signals and the received plurality of parallel data signals. Each of the plurality of selection circuits includes a data multiplexer configured to generate a plurality of data selection signals based on the received one of the plurality of parallel data signals and the plurality of clock signals; a control signal generator configured to generate first and second control signals based on the plurality of data selection signals; and an output driver connected to the output node, and configured to precharge the output node based on the first control signal or discharge the output node based on the second control signal.

Transmitter circuit including selection circuit, and method of operating the selection circuit

A probe device includes a first receiving terminal configured to receive a multi-level signal having M levels, where M is a natural number greater than 2; a second receiving terminal configured to receive a reference signal; a receiving buffer including a first input terminal connected to the first receiving terminal, a second input terminal connected to the second receiving terminal, and an output terminal configured to output the multi-level signal based on signals received from the first and second input terminals; and a resistor circuit comprising a plurality of resistors connected to the first and second receiving terminals and determining a magnitude of a termination resistance of the first and second receiving terminals.

Probe device, test device, and test method for semiconductor device

A multi-level signal transmitter includes a voltage selection circuit, which is configured to select one amongst a plurality of driving voltages, which have different voltage levels, in response to input data including at least two bits of data therein. A driver circuit is also provided, which is configured to generate an output data signal as a multi-level signal, in response to the selected one of the plurality of driving voltages. This selected signal is provided as a body bias voltage to at least one transistor within the driver circuit. This driver circuit may include a totem-pole arrangement of first and second MOS transistors having respective first and second body bias regions therein, and at least one of the first and second body bias regions may be responsive to the selected one of the plurality of driving voltages.

Transmitters for generating multi-level signals and memory system including the same

A memory package includes a package substrate including a redistribution layer and bonding pads connected to the redistribution layer, the redistribution layer including a plurality of signal paths; a buffer chip mounted on the package substrate and including a plurality of chip pads corresponding to a plurality of memory channels; and a plurality of memory chips stacked on the package substrate and divided into a plurality of groups corresponding to the plurality of memory channels, wherein memory chips of a first group, among the plurality of memory chips, are connected to first chip pads of the plurality of chip pads through first wires, and wherein memory chips of a second group, among the plurality of memory chips, are connected to second chip pads of the plurality of chip pads through second wires and at least a portion of the plurality of signal paths.

Memory package and storage device including the same

A multi-level signal receiver includes a data sampler circuit and a reference voltage generator circuit. The data sampler includes (M&#x2212;1) sense amplifiers which compare a multi-level signal having one of M voltage levels different from each other with (M&#x2212;1) reference voltages. The data sampler generates a target data signal including N bits, M is an integer greater than two and N is an integer greater than one. The reference voltage generator generates the (M&#x2212;1) reference voltages, At least two sense amplifiers of the (M&#x2212;1) sense amplifiers have different sensing characteristics.

Multi-level signal receivers and memory systems including the same

A memory device includes a memory cell array and a transmitter, wherein the transmitter includes a pulse amplitude modulation (PAM) encoder configured to generate a PAM-n first input signal (where n is an integer greater than or equal to 4) from data read from the memory cell array; a pre-driver configured to generate a second input signal based on the first input signal and based on a calibration code signal, and output the second input signal using a first power voltage; and a driver configured to output a PAM-n DQ signal using a second power voltage lower than the first power voltage in response to the second input signal.

Memory device for generating pulse amplitude modulation-based DQ signal and memory system including the same

A multi-mode transmission line includes a first and second conductive layers, first and second waveguide walls, a strip line, and a blind conductor. The second conductive layer that is formed over the first conductive layer. The first waveguide wall is elongated in a first direction and is in contact with the first conductive layer and the second conductive layer in a vertical direction. The second waveguide wall is elongated in the first direction parallel to the first waveguide wall and is in contact with the first conductive layer and the second conductive layer in the vertical direction. The strip line is formed between the first and second conductive layers and between the first and second waveguide walls. The blind conductor is connected to one of the first conductive layer, the second conductive layer, the first waveguide wall, or the second waveguide wall.

Multi-mode transmission line and storage device including the same

A semiconductor device includes: a multi-level receiver including N sense amplifiers and a decoder decoding an output of the N sense amplifiers, each of the N sense amplifiers receiving a multi-level signal having M levels and a reference signal (where M is a natural number, higher than 2, and where N is a natural number, lower than M); a clock buffer receiving a reference clock signal; and a clock controller generating N clock signals using the reference clock signal, inputting the N clock signals to the N sense amplifiers, respectively, and individually determining a phase of each of the N clock signals using the output of the N sense amplifiers.

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Suwon-si, South Korea

Jindo Byun