Nanoprotech Co., Ltd.

Lx Semicon Co., Ltd.

K-mac

Bilix Co., Ltd.

Jin Yong Kim

Yeong Ryeol Kim

Cheul Ock Chae

Jung Min Choi

Hyung Lee

Yong Hyun Lee

Sang Yong Jon

Jae Duck Kim

Joong Whan Lee

Sang Tae Kim

Dong Yun Lee

Jae Hyun Cho

Ji Jong Park

Soung Jin Kim

A touch sensing device is connected to a plurality of touch sensors to drive the plurality of touch sensors and to receive a sensing signal. The touch sensing device includes an input unit generating pieces of sensing data by using a sensing signal input from each of the plurality of touch sensors and a correction unit dividing the pieces of sensing data into a plurality of groups and applying different correction values to the sensing data of each of the plurality of groups to generate correction data.

Touch sensing device having group correction unit and driving method thereof

Provided is a bilirubin derivative-based ultrasound contrast agent for diagnosis and treatment. The fine particles including the bilirubin derivative are sensitive to reactive oxygen species (ROS), bind with hydrophobic drugs, and can effectively chelate metals such as iron oxide nanoparticles. Therefore, the fine particle of the present invention can be used as an ultrasound contrast agent for diagnosis, as a magnetic resonance imaging contrast agent, or as a carrier for hydrophobic drugs or platinum-based drugs.

Bilirubin derivative-based diagnostic and therapeutic ultrasound contrast agent

Provided are a foreign material detecting device and method for detecting only a foreign material on a surface of a substrate except for a foreign material on a lower surface of the substrate in a manufacturing process of a transparent substrate passing light therethrough, such as a glass substrate used in a flat panel display (FPD) such as a liquid crystal display (LCD), an organic light emitting diode (OLED), a plasma display panel (PDP), etc., a sapphire wafer used in some of semiconductors, or the like, and in a pattern forming process in a manufacturing process of the FPD and the semiconductor using the transparent substrate. More particularly, provided are a foreign material detecting device and method for detecting only a foreign material on a surface of an ultra-thin transparent substrate having a thickness of 0.3 T or less.

Upper surface foreign material detecting device of ultra-thin transparent substrate

Provided are an apparatus and a method of detecting a foreign material capable of detecting only a foreign material on a surface of a substrate except for a foreign material on a lower surface of the substrate in a manufacturing process of a transparent substrate passing light therethrough, such as a glass substrate used in a flat panel display (FPD) such as a liquid crystal display (LCD), an organic light emitting diode (OLED), a plasma display panel (PDP), a sapphire wafer used in some of semiconductors, or the like, and in a pattern forming process in a manufacturing process of the FPD and the semiconductor using the transparent substrate.

Method of detecting foreign material on upper surface of transparent substrate using polarized light

The present invention relates to a non-contact, non-destructive measuring apparatus that measures thickness profile and refractive index distribution of a single or multiple layers of thin films by means of the principle of reflectometry. According to the present invention, by employing more than one narrow band-pass optical filters and a two-dimensional array of CCD sensors, and by finding an optimal solution for the nonlinear functional relationship between the thickness of said thin film or thin films and the corresponding refractive indexes by using an iterative numerical computation method, said apparatus simultaneously measures local area-wise thickness profile and refractive index distribution among others of said a single layer or multiple layers of thin films on a substrate.

Apparatus for measuring characteristics of thin film by means of two-dimensional detector and method of measuring the same

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Daejeon, South Korea

Jin Yong Kim