Sensetime International Pte. Ltd.

Nanyang Technological University

Jin Wu

Shuai Yi

Kaige Chen

Haiyu Zhao

Daming Niu

Fengwei Huo

The present disclosure provides a method, apparatus and system for identifying target objects. The method includes: clipping out a target image from an acquired image, wherein the target image involves a plurality of target objects to be identified that are stacked; adjusting a height of the target image to a preset height, wherein a height direction of the target image corresponds to a direction in which the plurality of target objects are stacked; extracting a feature map of the adjusted target image; segmenting the feature map in a dimension corresponding to the height direction of the target image to obtain a preset number of segment features; and identifying the target objects based on each of the preset number of segment features.

Method, apparatus and system for identifying target objects

Embodiments of the present disclosure provide methods and apparatuses for obtaining sample images, and electronic devices. The method includes: acquiring images of stacked bodies, where the stacked bodies in different images have different item information, and the item information comprises: an attribute and a stacking mode of a stacked body; and taking an acquired image as a sample image when the acquired image meets an image quality condition.

Method and apparatus for obtaining sample images, and electronic device

Embodiments of the present specification provide a target recognition method, apparatus, and system. The method comprises: obtaining an image recognition result and a radio frequency recognition result of target objects in a target region, and then determining the distribution of the target objects in the target region according to the radio frequency recognition result and the image recognition result. Since the radio frequency recognition result and the image recognition result are fused, the target objects in the target region can be accurately recognized, so as to improve the recognition accuracy.

Method, apparatus, and system for recognizing target object

An apparatus for investigating a sample surface is disclosed. The apparatus comprises: a probe array comprising a substrate and a plurality of probe tips extending from the substrate, the probe tips comprising a transparent and deformable material and configured to contact the sample surface; an actuator configured to move the probe array towards the sample surface; a light source configured to illuminate the probe tips with an illumination through the substrate; and an image capture device arranged to detect a change in intensity of the illumination reflected from the probe tips.

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Singapore, Singapore

Jin Wu