Samsung Electronics Co., Ltd.

Jin-Seop Seo

Sun-Ju Kim

Sang-Jun Park

Hyun-Ho Park

Chang-Nyun Kim

A method and apparatus for testing memory devices under actual operating conditions can accommodate non-standard memory devices through the use of an interface board that adapts a non-standard pin configuration to a standard pin configuration on a test substrate. The interface board can include a first surface on which to mount the non-standard device, a pin matching circuit, and a second surface constructed and arranged to couple the pin matching circuit to a standard pin configuration. The interface board can be mounted directly on the test substrate, or coupled to the test substrate through various arrangements of sockets, connection boards, and supports.

Growing community of inventors

Chungcheongnam-do, South Korea

Jin-Seop Seo