Hyundai Electronics Industries Co. Ltd.

Jin-Keun Oh

Ho-Youb Cho

Chang-Hyuk Lee

Jae-Kyung Wee

Phil-Jung Kim

Young-Ho Seol

Jae-Seok Park

Oh-Won Kwon

A memory repair circuit uses an antifuse of MOS structure, capable of repairing defective cells by constructing the antifuse by MOS transistors and programming the antifuse circuit properly. The memory repair circuit comprises a plurality of antifuse devices, each programmed when a power voltage and a negative voltage are supplied respectively to a first electrode and a second electrode thereof; a latch for detecting and latching program states of the antifuse devices; and a redundancy block for replacing a defect cell with a redundancy cell depending on the output of the latch.

Memory repair circuit using antifuse of MOS structure

A repair circuit substitutes a defective cell with a redundancy cell. For the purpose, the repair circuit includes an antifuse programmed by a voltage difference of both ends thereof, a programming circuit for programming the antifuse, a detection circuit for detecting whether the antifuse is programmed or unprogrammed by using a first and a second power stabilization signal of a power up reset circuit, wherein the detection is performed during a power stabilization period or after the power stabilization period, a latch circuit for latching the result of the detection to thereby generate an output signal, and a redundancy circuit having a redundancy cell for repairing the defective cell in response to the output signal of the latch circuit.

Repair circuit using antifuse

An antifuse circuit provides a stabilized high voltage to an antifuse programming circuit through the use of an NC pin which is not used in the chip operation. For the purpose, the antifuse circuit includes a power-up detecting circuit for generating a power stabilization signal by detecting a supply voltage; a power-up pulse circuit for generating a first and a second control signal in response to the power stabilization signal; an antifuse programming circuit for, under the control of the first and the second control signals, detecting whether an antifuse element is programmed or not, latching the result of the detection and programming the antifuse element in response to an external high voltage and a precharge signal; a pin for receiving the external high voltage so as to program the antifuse element; a pad for providing the external high voltage to the inside of the chip; and a diode for supplying the external high voltage to the antifuse programming circuit and preventing a voltage of the antifuse programming circuit from being provided to the pin.

Antifuse circuit being programmable by using no connection pin

Growing community of inventors

Kyoungki-do, South Korea

Jin-Keun Oh