Kabushiki Kaisha Toshiba

Jin Kashiwagi

Yoshihiko Kamata

Akira Umezawa

Yasuhiko Honda

Yasuyuki Eguchi

Takayuki Kawaguchi

Hideaki Yamazaki

Takatomi Izumi

A memory system according to the present embodiment includes a memory controller including a first data bus and a first address bus. A memory part includes a second data bus and a second address bus. A bridge part is capable of receiving an address from the memory controller via the first data bus, and outputs the address via the first address bus to the memory part.

Memory system with a bridge part provided between a memory and a controller

A nonvolatile semiconductor memory comprises a memory cell array in which a plurality of memory cell transistors capable of storing data according to a threshold voltage; a row decoder having a plurality of transfer MOS transistors connected at first ends to a plurality of word lines which are respectively connected to control gate electrodes of the plurality of memory cell transistors; and a word line driver which selects supplied voltages and supplies the selected voltages to second ends of the plurality of transfer MOS transistors. The nonvolatile semiconductor memory further comprises a voltage generation circuit which supplies voltages to the word line driver; and a control circuit which controls operation of the row decoder, the word line driver and the voltage generation circuit.

Nonvolatile semiconductor memory

A semiconductor memory capable of storing and reading data in a memory cell for holding the data corresponding to a threshold voltage has a reference current generating circuit having a reference current generating section and an amplifier section.

Semiconductor memory with a reference current generating circuit having a reference current generating section and an amplifier section

A non-volatile semiconductor memory device comprises a redundant memory cell to store address data of a defect cell in a memory cell array. A first decoder circuit is given a first drive voltage to provide a control signal to the redundant memory cell. A dummy memory cell has a threshold voltage corresponding to the redundant memory cell. A second decoder circuit is given a second drive voltage corresponding to the first drive voltage to provide a control signal to the dummy memory cell. A comparator circuit compares data to be read out of the dummy memory cell with data actually read out of the dummy memory cell.

Non-volatile semiconductor memory device

A reference voltage generating circuit generates reference voltage and outputs the thus generated reference voltage from an output terminal thereof. A voltage generating circuit lowers external power supply voltage according to the reference voltage supplied from the reference voltage generating circuit to output internal power supply voltage from an output terminal thereof. A transistor has a current path connected between a terminal to which the external power supply voltage is supplied and the output terminal of the voltage generating circuit or between the terminal to which the external power supply voltage is supplied and the output terminal of the reference voltage generating circuit and a gate supplied with constant voltage and has negative threshold voltage.

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Yokohama, Japan

Jin Kashiwagi