Samsung Electronics Co., Ltd.

Fairchild Korea Semiconductor Ltd.

Kt Corporation

Jin-Ho Choi

Jin Hee Kwon

Young-Hoon Kim

Seung-Hoon Park

Jae-Yong Lee

Sang-Wook Kang

Tae-Kwang Um

Young-jun Kim

Da-Som Lee

Jae-Yung Yeo

Il-Hwan Choi

Hyun-Ju Seo

Chang-Ho Lee

Min-Woo Kim

Jong-Ryun Choi

Jung-Ho Lee

Yong-Joo Lee

Young-hwa Yun

Sanghune Park

Dong-Young Huh

Kwanyeob Chae

Sang-Hune Park

Kyunghoi Koo

Young-Chul Ryu

Sanghoon Joo

Ho-Kyu Choi

Chang Ho Lee

Min Woo Kim

Sung-Oh Hwang

Chang-soo Park

Jun Young Lee

Hyun-Woo Lee

Tae Kyun Kim

Nari Choi

Jong-Tae Hwang

Gye-Hyun Cho

Jun-ho Choi

Ji-hun Oh

Hyung-Won Yoon

Hyung Sok Yeo

Byung-Jin Chun

Young-Jun Lee

Na-ri Choi

Dae Soo Kim

Jae-Kon Kim

Kyoung Choul Jang

Dae-soo Kim

Hyang-Hwa Kwon

Su Young Ko

Kyoung-Il Seo

Seong Hwa Park

Seong-Dai Jang

Gun-Won Lee

Han Ju Nam

Diana Min-Sun Kang

Yun-Cheol Kim

Dae-ro Kim

Jae-Sub Song

Yong-Chul Ryu

Jin-Sung Kim

Dae-Soo Kim

Han-ju Nam

Dong-young Huh

Seung Bin Ko

Seok-Kyun Ko

Dong Joo Roh

Sin-Seob Kang

Han-Ju Nam

An artificial intelligence system and method are disclosed herein. The system includes a processor which implements the method, including: receiving by an input unit a first user input including a request to execute a task using at least one of the electronic device or an external device, transmitting by a wireless communication unit first data associated with the first user input to an external server, receiving a first response from the external server including information associated with at least one of the first user input and a sequence of electronic device states for performing at least a portion of the task, receiving a second user input assigning at least one of a voice command and a touch operation received by a touch screen display as the request to perform the task, and transmitting second data associated with the second user input to the external server.

Electronic device and method of executing function of electronic device

An apparatus for testing a semiconductor device is described. The apparatus includes a test chamber in which a test process for a plurality of semiconductor devices is performed, a first storage disposed in the test chamber with a first semiconductor device located therein, a second storage spaced apart in a first direction from the first storage with a second semiconductor device located therein, a first nozzle extending in the first direction on a first sides of the first and second storages and including a plurality of first air outlets configured to discharge air, a second nozzle extending in the first direction on and including a plurality of second air outlets configured to discharge air, and a controller controlling temperatures of the first and second semiconductor devices within a predefined temperature range by controlling the air discharged by the first and second nozzles.

Apparatus for testing semiconductor device

A test system for a memory device includes: a chamber including at least one test socket column having a plurality of test sockets arranged in a first direction, wherein memory devices to be tested are in respective ones of the plurality of test sockets, a temperature adjusting apparatus configured to supply air into the chamber according to a temperature control signal to control a temperature of the chamber, a test device electrically connected to the test sockets and configured to test the memory devices, and a temperature controller configured to receive temperature information of the memory devices from temperature sensors of the memory devices and to output to the temperature adjusting apparatus the temperature control signal to compensate for a temperature difference between a detected temperature of the memory devices and a target temperature.

Test chamber for memory device, test system for memory device having the same and method of testing memory devices using the same

A semiconductor chip including a plurality of input/output units includes: a plurality of additional pads disposed on a surface of the semiconductor chip, wherein the plurality of additional pads include at least one of a first additional pad to which a ground voltage is applied and a second additional pad to which a power supply voltage is applied; and a plurality of pads disposed on the surface of the semiconductor chip, wherein the plurality of pads include at least one of a first pad to which the ground voltage is applied and a second pad to which the power supply voltage is applied, and further include a third pad through which a signal is input and/or output. The at least one of the first additional pad and the second additional pad is disposed on an input/output unit where the third pad is disposed, among the plurality of input/output units.

Semiconductor chip including a plurality of pads

A memory controller for receiving a differential data strobe signal and an application processor having the memory controller are disclosed. The memory controller includes a strobe signal receiver configured to receive first and second strobe signals from a memory device as differential data strobe signal and output a first detection signal based on a level of each of the first and second strobe signals, a comparator configured to receive the second strobe signal and a reference voltage and compare a level of the second strobe signal with a level of the reference voltage to output a second detection signal, and a gate signal generator configured to generate a gate signal masking a portion of a period corresponding to the differential data strobe signal using the first detection signal and the second detection signal.

Memory controller for receiving differential data strobe signals and application processor having the memory controller

An X-ray imaging method and an apparatus having an improved structure configured to reduce pain and discomfort during a procedure. The X-ray imaging apparatus acquires an X-ray image by compressing an object that is irradiated by an X-ray source. An X-ray detector includes an object contact material that contacts the object. X-rays that pass through the object are detected X-rays, an electrical signal is generated based on the X-rays. A paddle is disposed between the X-ray source and the X-ray detector to be vertically adjustable relative to the X-ray source and X-ray detector so as to compress the object placed on the object contact surface. The paddle includes a supporting member, a pressure member coupled to the supporting member, and at least one adjustment member arranged between the supporting member and the pressure member to regulate movement of the pressure member according to the shape of the object.

X-ray imaging apparatus and control method for the same

Disclosed is an X-ray detector having impact resistance and an X-ray imaging apparatus having the X-ray detector. The X-ray imaging apparatus comprises an X-ray source for generating and irradiating X-rays and an X-ray detector for detecting the X-rays irradiated from the X-ray source. The X-ray detector comprises a main body having a bottom plate including a joining groove, a detector panel arranged inside the main body for converting X-rays irradiated from the X-ray source into electric signals, and a middle block arranged inside the main body to support the detector panel. The middle block has a boss configured to protrude toward the bottom plate of the main body. The boss is inserted into the joining groove. A buffer member is arranged in at least part of the joining groove to prevent the boss from coming into contact with the joining groove.

X-ray detector and X-ray imaging apparatus having the same

A transmitter circuit including a pre-driver circuit configured to receive a logic signal from a logic circuit and to generate a first signal driven by a first voltage, the pre-driver circuit including a transistor having a threshold voltage equal to or lower than a threshold voltage of a transistor included in the logic circuit, and a main-driver circuit configured to receive the first signal and generate a second signal driven by a second voltage, the main-driver circuit configured to output the second signal to an input/output pad, the main-driver circuit including a transistor having a threshold voltage which is equal to or lower than the threshold voltage of the transistor included in the logic circuit may be provided.

Transmitter circuit and receiver circuit for operating under low voltage

A method and an apparatus for providing an augmented reality (AR) function of showing virtual information objects overlaid on a real image or background (for example, a real world) as one image in an electronic device are provided. The electronic device includes a camera, a display for displaying an AR screen, and at least one processor functionally connected to the camera module and the display. The at least one processor is configured to implement an AR function, determine a plurality of contents according to a set criterion in a view direction of a user, group the plurality of contents into at least one group, generate a group card corresponding to the plurality of contents and a single card corresponding to a single content based on a grouping result, and display the group card and the single card mapped to a real object on the AR screen.

Method and apparatus for providing augmented reality function in electronic device

An X-ray apparatus includes an X-ray source configured to radiate X-rays, a collimator configured to adjust a radiation field of the X-rays and rotate on an optical axis direction of the X-rays, a ring-shaped first rotation transfer unit centered on an optical axis of the X-rays in the X-ray source, a second rotation transfer unit interlocked with the ring-shaped first rotation transfer unit and configured to rotate as the collimator rotates, a rotation sensor configured to sense an amount of rotation of the second rotation transfer unit, and a detector comprising a receiving surface on which the X-rays radiated from the collimator are incident.

X-ray apparatus comprising a collimator and method of operating the collimator

A semiconductor device receiving a differential data strobe signal and a method of operating the same are provided. The semiconductor device includes a differential signal phase detector receiving a differential signal including a first signal and a second signal, detecting a phase of the differential signal, and generating a mode control signal; and a receiver receiving the differential signal and a reference voltage and performing a processing operation using the differential signal in a differential mode or using the first signal and the reference voltage in a single mode according to the mode control signal. The semiconductor device may be a memory controller. Data transfer may be disabled in the single mode to prevent false data recognition due to noise.

Semiconductor device and memory controller receiving differential signal

Growing community of inventors

Seoul, South Korea

Jin-Ho Choi