Matsushita Electric Industrial Co., Ltd.

Jimpei Tabata

Satoshi Miyagawa

On a substrateholding a sample to be detected, a dielectric multilayeris disposed which reflects excitation light esupplied from above the substrateand transmits fluorescence femitted from the sample, and the excitation light eis reflected at the dielectric multilayerwhile the transmitted fluorescence fis detected by a light receiving unit, thereby providing a fluorescence measurement apparatus which can resolve a problem of reduction in detection sensitivity due to autofluorescence from the substrate or leakage of the excitation light from a light receiving filter, and which can detect the sample with high sensitivity.

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Toon, Japan

Jimpei Tabata