Vuemetrix, Inc.

Opto Electronic Systems, Inc.

Jim Tark Chiu

Paul Cornelius

Jack Stephen Kessler

A laser system includes a laser generation element and a pulse width modulated (PWM) signal generator that uses a clock to generate a control signal having a period based on the clock frequency and includes a pulse width between a rising edge and a falling edge. The system also includes a switch mode power supply controlled by the control signal output by the PWM signal generator for providing power to the laser generation element based on the control signal. Also, the system includes a signal modification circuit that selectively delays the rising edge of each period of the control signal by one of one or more selectable durations thereby reducing the pulse width by a quantity, wherein the quantity is smaller than a minimum increment amount that the pulse width is able to change based on the clock frequency.

Digital pulse width modulation power supply with pico second resolution

A laser diode control system is configured to limit cascade failure of a series of laser diodes. The laser diode series is coupled to an output filter of a power supply. The power supply is a switch-mode power supply and the output filter includes an LC circuit. The laser diode control system includes a protection circuit coupled to the laser diode series. The protection circuit includes a post regulator circuit and an inductor coupled in series to the laser diode series. The post regulator includes a transistor and two amplifiers configured to regulate a voltage across the transistor. In the event of a failure within the laser diode series, a current spike across the laser diode series is prevented by regulating the voltage across resistor.

Circuit limiting cascade failure of a series of laser diodes

A testing system includes a device independent handling system utilizing removable collets that are customized for various device configurations and provide unique mechanical, thermal and electrical contact to a device-under-test (DUT) without the use of clamps, screws or traditional means of securing a DUT in a test or burn in fixture. The system is designed for automatically loading and positioning each of a plurality of laser diode sub-assemblies, an optical system for automatically receiving each laser diode subassembly from the handling system and automatically performing one or more tests to measure functionality of each laser diode sub-assembly, a detection system for detecting characteristics associated with one or more tests performed by the optical system for each laser diode sub-assembly, and a control system for automatically receiving detected characteristics from the detection system, comparing the detected characteristics to stored expected characteristics for a properly functioning laser diode sub-assembly, and providing control instructions to the optical system based on the comparison. The one or more tests are performed by automatically positioning a lens such that light generated from the laser diode sub-assembly is formed into laser light, and each test measures a desired characteristic of the laser light.

Growing community of inventors

Los Altos, CA, United States of America

Jim Tark Chiu