Antares Advanced Test Technologies, Inc.

Jim Jaquette

Steve Fahrner

Gene Tokraks

An interconnect assembly for providing electrical interconnection between elements of a probe card assembly is provided. The interconnect assembly includes a frame defining a plurality of openings and a plurality of conductive contacts coupled to the frame. Each of the conductive contacts includes (a) a first resilient arm extending away from a first surface of the frame and (b) a second resilient arm extending away from a second surface of the frame. At least one of the first resilient arm or the second resilient arm extends through one of the plurality of openings.

Growing community of inventors

Mesa, AZ, United States of America

Jim Jaquette