Growing community of inventors

Kirkland, WA, United States of America

Jim Inoue

Average Co-Inventor Count = 6.60

ph-index = 2

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 15

Jim InoueMyles Scolnick (12 patents)Jim InoueJack Grossman (8 patents)Jim InoueThomas Powell (6 patents)Jim InoueBianca Rahill-Marier (6 patents)Jim InoueQuentin Spencer-Harper (5 patents)Jim InoueRichard Niemi (5 patents)Jim InoueThomas Mcintyre (5 patents)Jim InoueBenjamin Lee (4 patents)Jim InoueBenjamin Grabham (4 patents)Jim InoueArion Sprague (4 patents)Jim InoueGregoire Omont (4 patents)Jim InoueMichael Xiaoxuan Yang (2 patents)Jim InoueMark Elliot (2 patents)Jim InoueSteven Fackler (2 patents)Jim InoueAndre Frederico Cavalheiro Menck (2 patents)Jim InoueRyan Rowe (2 patents)Jim InoueAndy Chen (2 patents)Jim InoueWilliam Seaton (2 patents)Jim InoueRick Ducott (2 patents)Jim InouePaul Gribelyuk (2 patents)Jim InoueAndrew Poh (2 patents)Jim InoueMaciej Albin (2 patents)Jim InoueJonah Scheinerman (2 patents)Jim InoueAakash Goenka (2 patents)Jim InoueAlexander Taheri (2 patents)Jim InoueJeremy Kong (2 patents)Jim InoueSubbanarasimhiah Harish (2 patents)Jim InoueTarik Benabdallah (2 patents)Jim InoueDiogo Bonfim Moraes Morant De Holanda (2 patents)Jim InoueTao Wei (2 patents)Jim InoueRagnar Vorel (2 patents)Jim InoueTam-Sanh Nguyen (2 patents)Jim InoueFrancis Screene (2 patents)Jim InouePierre Lucotte (2 patents)Jim InoueAlexandru Antihi (1 patent)Jim InoueAlexandru-Viorel Antihi (1 patent)Jim InoueBianca Rahill-Marier (1 patent)Jim InoueJim Inoue (12 patents)Myles ScolnickMyles Scolnick (23 patents)Jack GrossmanJack Grossman (33 patents)Thomas PowellThomas Powell (27 patents)Bianca Rahill-MarierBianca Rahill-Marier (20 patents)Quentin Spencer-HarperQuentin Spencer-Harper (21 patents)Richard NiemiRichard Niemi (8 patents)Thomas McintyreThomas Mcintyre (6 patents)Benjamin LeeBenjamin Lee (9 patents)Benjamin GrabhamBenjamin Grabham (6 patents)Arion SpragueArion Sprague (4 patents)Gregoire OmontGregoire Omont (4 patents)Michael Xiaoxuan YangMichael Xiaoxuan Yang (151 patents)Mark ElliotMark Elliot (83 patents)Steven FacklerSteven Fackler (20 patents)Andre Frederico Cavalheiro MenckAndre Frederico Cavalheiro Menck (20 patents)Ryan RoweRyan Rowe (15 patents)Andy ChenAndy Chen (10 patents)William SeatonWilliam Seaton (10 patents)Rick DucottRick Ducott (10 patents)Paul GribelyukPaul Gribelyuk (9 patents)Andrew PohAndrew Poh (9 patents)Maciej AlbinMaciej Albin (9 patents)Jonah ScheinermanJonah Scheinerman (8 patents)Aakash GoenkaAakash Goenka (8 patents)Alexander TaheriAlexander Taheri (8 patents)Jeremy KongJeremy Kong (7 patents)Subbanarasimhiah HarishSubbanarasimhiah Harish (5 patents)Tarik BenabdallahTarik Benabdallah (5 patents)Diogo Bonfim Moraes Morant De HolandaDiogo Bonfim Moraes Morant De Holanda (5 patents)Tao WeiTao Wei (4 patents)Ragnar VorelRagnar Vorel (2 patents)Tam-Sanh NguyenTam-Sanh Nguyen (2 patents)Francis ScreeneFrancis Screene (2 patents)Pierre LucottePierre Lucotte (2 patents)Alexandru AntihiAlexandru Antihi (8 patents)Alexandru-Viorel AntihiAlexandru-Viorel Antihi (4 patents)Bianca Rahill-MarierBianca Rahill-Marier (3 patents)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Palantir Technologies Inc. (12 from 1,611 patents)


12 patents:

1. 12321394 - System and method for querying a data repository

2. 12032583 - Data analysis system and method

3. 11681282 - Systems and methods for determining relationships between defects

4. 11475070 - System and method for querying a data repository

5. 11423038 - Data analysis system and method

6. 11301499 - Systems and methods for providing an object platform for datasets

7. 10885120 - System and method for querying a data repository

8. 10838970 - Data analysis system and method

9. 10839504 - User interface for managing defects

10. 10691729 - Systems and methods for providing an object platform for a relational database

11. 10620618 - Systems and methods for determining relationships between defects

12. 10249033 - User interface for managing defects

Please report any incorrect information to support@idiyas.com
idiyas.com
as of
12/5/2025
Loading…