Intel Corporation

Jim Baldo

Simon Yang

Melton C Bost

Yeochung Yen

Barbara Greenebaum

A tri-layer titanium coating for an aluminum layer of a semiconductor device. An aluminum layer used for interconnecting individual devices of an integrated circuit is formed on a semiconductor material. A first titanium nitride layer is deposited on the aluminum layer. A titanium layer is deposited on the first titanium nitride layer. A second titanium nitride layer is then deposited on the titanium layer. The tri-layer titanium coating prevents the formation of Al.sub.2 O.sub.3 and AIF.sub.3 during the etching of a via hole in an intermetal dielectric layer deposited above the second titanium nitride layer.

Tri-layer titanium coating for an aluminum layer of a semiconductor

A tri-layer titanium coating for an aluminum layer of a semiconductor device. An aluminum layer used for interconnecting individual devices of an integrated circuit is formed on a semiconductor material. A first titanium nitride layer is deposited on the aluminum layer. A titanium layer is deposited on the first titanium nitride layer. A second titanium nitride layer is then deposited on the titanium layer. The tri-layer titanium coating prevents the formation of Al.sub.2 O.sub.3 and AlF.sub.3 during the etching of a via hole in an intermetal dielectric layer deposited above the second titanium nitride layer.

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Beaverton, OR, United States of America

Jim Baldo