Intel Corporation

Jim B Crossland

Hong Wang

Murugasamy K Nachimuthu

Per H Hammarlund

Scott Dion Rodgers

Ittai Anati

Koichi Yamada

Gautham N Chinya

Bryant E Bigbee

Xiang Chris Zou

John P Shen

Jose Andy Vargas

Chris J Newburn

Suresh K Marisetty

Robert Geva

Baskaran Ganesan

Robert P Knight

Gautam Doshi

Stan Domen

Method, apparatus, and system for a programmable event-driven yield mechanism. The mechanism may disrupt processing of a program to deliver a yield event. The event may be treated as a fault-like yield event or a trap-like event. For a fault-like yield event, the faulting instruction is canceled before retirement and processor state is not updated before the yield event is delivered. For a trap-like yield event the instruction causing the trap is retired and the yield event is delivered on an interrupt boundary. Multiple pending yield events may be handled according to priority. Other embodiments are also described and claimed.

Programmable event-driven yield mechanism

Configurable error handling apparatus and methods to operate the same are disclosed. An example apparatus comprises a processor core in a semiconductor package, a hardware functional block in the semiconductor package, an error handler in the semiconductor package, wherein the error handler is configurable to route error data from the hardware functional block to at least one of a first error log or a second error log and to route error signals from the hardware functional block to at least one of an operating system or firmware, and wherein the processor core configures the error handler and the hardware functional block.

Configurable error handling apparatus and methods to operate the same

Growing community of inventors

Banks, OR, United States of America

Jim B Crossland