Baker Hughes, a Ge Compnay, LLC

Jijun Gu

Kevin George Harding

Clark Alexander Bendall

Dongmin Yang

Jie Han

Zirong Zahi

A probe system and a method are provided. The probe system includes an emitter unit, a pattern generation system, and an intensity modulator. The emitter unit is for emitting light. The pattern generation system is for projecting at least one reference structured-light pattern onto an object surface to obtain at least one reference projected pattern, and including a mirror scanning unit for reflecting the light to a plurality of directions. The intensity modulator is for modulating intensity of the light according to the at least one reference projected pattern to provide modulated light to the mirror scanning unit to reflect the modulated light to the plurality of directions to project at least one modulated structured-light pattern onto the object surface to obtain at least one modulated projected pattern.

Growing community of inventors

Shanghai, China

Jijun Gu