Korea Advanced Institute of Science and Technology

Samsung Display Co., Ltd.

Jiho Park

Hoon Sohn

Soonkyu Hwang

Donghyun Kim

Young Hun Lee

Minsang Koo

Sanghyuk Kwon

Chulhee Choi

Sangwoo Choi

Eunchul Shin

Woojin Jung

Jihoon Jeong

Yeongil Kim

Seungmo Choi

Jinki Noh

Jeongsik Yoo

Kyuha Chong

An apparatus for inspecting a display panel for defects includes a table which supports the display panel, a laser excitation unit that irradiates a non-display area of the display panel with a point laser beam, a thermal wave detecting unit that generates thermal wave images of irradiated portions of the non-display area, a driving unit, and a control unit. A groove corresponding to an edge of the display panel may be defined in a top surface of the table. A defect, such as a crack, may be detected by comparing a defect pattern obtained from the thermal wave images with a pre-registered defect pattern.

Apparatus for inspecting a display panel for defects

A method of performing visualized measurement on thickness distribution of a paint film and an apparatus therefor. A measurement target region is heated by a heating unit that applies a light beam while moving relative to the measurement target region of a measurement target structure. A sensing unit moving together with the heating unit generates a plurality of thermal images related to a phenomenon in which thermal energy is propagated in the measurement target region by scanning and photographing the heated measurement target region. The thermal images in a dynamic state are converted into time-spatial-integrated thermal images in a static state by performing coordinate transformation according to a time-spatial-integrated coordinate transformation algorithm. A thickness of the paint film is calculated by using a Fourier thermal conduction equation. A noise caused by an external heat source is removed by subtracting a pre-heating time-spatial-integrated thermal image from the converted time-spatial-integrated thermal image.

Method of performing visualized measurement on thickness distribution of paint film and apparatus therefor

A method for collecting silver ions and phosphoric acid in a waste fluid includes collecting silver chloride from the waste fluid, collecting silver chloride including providing a chloride compound to the waste fluid; and collecting phosphoric acid, collecting phosphoric acid including distilling the waste fluid from which the silver chloride has been collected.

Method for collecting silver ions and phosphoric acid in waste fluid

Disclosed herein are a nanopreparation having a micelle structure for diagnosis or treatment of cancer diseases, and a method of preparing the same, and more particularly, a nanopreparation having a micelle structure available for diagonosis or treatment of cancer diseases and a method for preparing the same, wherein the nanopreparation is prepared by encapsulating a photosensitizer by forming micelle with polymeric lipid DSPE-mPEG. The nanopreparation having the micelle structure according to the present invention has a size of 12 nm or less by encapsulating hypericin, which is a photosensitizer, by forming micelle with polymeric lipid DSPE-mPEG having a molecular weight of 1500 to 2500. Resultingly, the nanopreparation easily overcomes a blood-tumor barrier (BTB) and an interstitial fluid pressure and has light induced cytotoxicity efficiency that is about more than 2.5 times higher than that of the case where hypericin is used alone.

Micelle structure of nano preparation for diagnosis or treatment of cancer disease and preparation method thereof

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Daejeon, South Korea

Jiho Park