Princeton Technology Corporation

Jie-Wei Huang

Cheng-Yung Teng

Yi-Chang Hsu

Huei-Huang Chen

Li-Jieu Hsu

A test system for testing a plurality of devices under test is disclosed. The test system includes a tester and a plurality of processors. The tester is used for providing a plurality of control signals and determining a plurality of test results for the devices under test according to a plurality of measurement results. Each processor coupled to the tester is used for generating a plurality of test signals according to the plurality of control signals. The plurality of devices under test respectively generates the plurality of test results according to the plurality of test signals.

Test system

The invention discloses a circuit testing apparatus for testing a device under test. The circuit testing apparatus includes a precision measurement unit, a signal transformation module, and a microprocessor. The precision measurement unit is coupled to the device under test for providing a testing signal and receiving a measurement signal generated according to the testing signal. The signal transformation module is coupled to the precision measurement unit for receiving the measurement signal and transforming the measurement signal to a signal measurement result according to a predetermined manner. The microprocessor is coupled to the precision measurement unit and the signal transformation module for examining the signal measurement result to determine a test result for the device under test.

Growing community of inventors

Taipei County, Taiwan

Jie-Wei Huang