Optowaves, Inc.

Jie Jensen Hou

Tsung-Han Tsai

Hao Wu

Shanxing Su

Jiaqi Zhang

A multiplexed LiDAR system generates an image of an object based on the distance of various point measurements to the object. The multiplexed LiDAR utilizes at least two sets of light source emissions to a scanner to simultaneously form multiple scanning patterns that effectively increase the scanning speed, scanning area, or image pixel density of the LiDAR system.

Multiplexed light detection and ranging apparatus

A TOI LiDAR System generates an image of an object based on the distance of various point measurements to the object. The TOI LiDAR System detects the envelope of an electrical signal created from an interference light signal. The interference light signal is produced from the back-reflected light resulting from a sampling arm light emission to the object combined with a reference light emission. The reference light emission is created by splitting a pulse-modulated coherent light source's emission signal and passing the reference light emission through a reference arm. The optical interference signal is transferred to a balanced photodetector to convert to an electrical signal converted to digital data. The digital data is evaluated to determine the rising edges or falling edges of a digitized electrical interference signal to determine a time delay between the reference light emission and back-reflected light used to calculate the distance.

High-speed time-of-interference light detection and ranging apparatus

A TOI Lidar System generates an image of an object based on the distance of various point measurements to the object. The TOI Lidar System detects the envelope of an electrical signal created from an interference light signal. The interference light signal is produced from the back-reflected light resulting from a sampling arm light emission to the object combined with a reference light emission. The reference light emission is created by splitting a pulse-modulated coherent light source's emission signal and passing the reference light emission through a reference arm. The optical interference signal is transferred to a balanced photodetector to convert to an electrical signal converted to digital data. The digital data is evaluated to determine the rising edges or falling edges of a digitized electrical interference signal to determine a time delay between the reference light emission and back-reflected light used to calculate the distance.

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El Dorato Hills, CA, United States of America

Jie Jensen Hou