General Electric Company

Baker Hughes, a Ge Compnay, LLC

Jie Han

Kevin George Harding

Dongmin Yang

Tao Li

Guiju Song

Zirong Zhai

Clark Alexander Bendall

Gil Abramovich

Zirong Zahi

Jijun Gu

A probe system and a method are provided. The probe system includes an emitter unit, a pattern generation system, and an intensity modulator. The emitter unit is for emitting light. The pattern generation system is for projecting at least one reference structured-light pattern onto an object surface to obtain at least one reference projected pattern, and including a mirror scanning unit for reflecting the light to a plurality of directions. The intensity modulator is for modulating intensity of the light according to the at least one reference projected pattern to provide modulated light to the mirror scanning unit to reflect the modulated light to the plurality of directions to project at least one modulated structured-light pattern onto the object surface to obtain at least one modulated projected pattern.

Light modulation for inspection probes

An optical system configured to visually inspect a target having a variable position with respect to the optical system is provided. The optical system includes a polarizer configured to convert an incident light reflected or diffused from the target into linearly polarized light; a light modulating element configured to modulate a polarization state of the linearly polarized light in response to control signals; and a lens group comprising at least one birefringent element, the birefringent element configured to refract or reflect the modulated linearly polarized light with a first polarization state under a first refraction index to enable inspection of the target at a first object position, and the birefringent element further configured to refract or reflect the modulated linearly polarized light with a second polarization state under a second refraction index to enable inspection of the target at a second object position.

Inspection device and method thereof

An optical imaging system includes a birefringent element, a light modulating element, and a polarizer element. The birefringent element is configured for decomposing un-polarized light into first linear polarized light and second linear polarized light under different refractive indexes to respectively form a first focal length and a second focal length in the optical imaging system. The light modulating element is configured for modulating a state of polarization of the first and second linear polarized light in response to control signals. The polarizer element is configured for filtering out one of the modulated first and second linear polarized light for creating a single image.

Optical imaging system and method, and aperture stop assembly and aperture element

Growing community of inventors

Shanghai, China

Jie Han