Olympus Scientific Solutions Americas Corp.

Jiawei Tan

Fabrice Cancre

Ted Michael Shields

Herein disclosed is an x-ray florescence (XRF) test system which comprises an XRF test instrument used for testing a test target's responses to X-rays, the instrument including a test window allowing the X-ray and its responsive energy to pass through, and at least one window protecting film allowing X-rays to pass through and providing protections to the window, the film being configured to be coupled with the window in a fashion to be removed from or applied or reapplied over the window. The corresponding calibration mode can be manually or automatically applied according to the specific film presently in use.

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Bedford, MA, United States of America

Jiawei Tan