Boe Technology Group Co., Ltd.

Beijing Zhongxiangying Technology Co., Ltd.

Chengdu Boe Optoelectronics Technology Co., Ltd.

Jiawei Ren

Hong Wang

Yu Wang

Jianmin Wu

Haijin Wang

Yi Chen

Bin Gao

Yu Feng

Fan Zhang

Zhiyong Zhang

Dong Chai

Jing Xue

Chuan Wang

Tian Lan

Wangqiang He

Qingde Long

Jianfeng Zeng

Danhui Li

Changyu Fu

Xuejie Bai

Degang Zhao

The present disclosure provides data processing methods and apparatuses, an electronic device and a storage medium. The method includes: obtaining a product sample set; obtaining combination features in specified dimensions of the product sample set by processing a second parameter based on a preset dimension reduction algorithm; obtaining influence scores respectively for the combination features in specified dimensions based on a first parameter and the combination features in specified dimensions; obtaining at least one combination feature ranked top by sorting the combination features based on the influence scores, and taking a raw parameter corresponding to the at least one combination feature as a cause of the product defect. In the embodiments of the present disclosure, combination features in R dimensions may be a combination of raw parameters having similarity such that similar parameters are associated while raw information of the product samples is retained, thus helping fast locating the cause of the product defect, and improving the detection efficiency.

Data processing methods and apparatuses, electronic device and storage medium

The present disclosure provides a method for processing defect information of a product, which includes the following steps of: acquiring defect information on a current film layer and defect information on historical film layers; determining whether defect information exists at a target location of the historical film layer if defect information exists at a target location of the current film layer; if defect information exists for a corresponding location to the target location in at least one of the historical film layers, deleting the defect information detected at the target location in the current film layer; and if no defect information exists for the target location in any of the historical film layers, retaining the defect information detected at the target location in the current film layer. According to this, for the defect information on the current film layer, only the defect information caused by factors of the current film layer may be retained, and the defect information caused by the historical film layers will not be retained, and thus, on the one hand, the stored data volume may be reduced, and on the other hand, the complexity of subsequent analysis of defect information may be simplified.

Methods and devices for processing and retrieving defect information of product

A method for manufacturing color filter, a color filter, and a display device including the color filter are disclosed. The method for manufacturing a color filter includes: forming a black matrix on a transparent substrate; forming a photosensitive resist layer on the transparent substrate with the black matrix; disposing a reflection sheet capable of reflecting light on a first side of the transparent substrate to be exposed, the first side being provided with the black matrix; disposing a mask on a second side of the transparent substrate to be exposed, the second side being not provided with the black matrix; and carrying out an exposing process from the second side of the transparent substrate.

Method for manufacturing color filter, color filter, and display device

Growing community of inventors

Beijing, China

Jiawei Ren