Micron Technology Incorporated

Intel Corporation

Jiawei Chen

Qiang Tang

Luigi Pilolli

Agatino Massimo Maccarrone

Examples described herein can be used to calibrate resistances provided by pull-up and pull-down circuits in an output driver circuit. A first reference voltage can be determined and applied to set a resistance level of a pull-up circuit to a desired level. A code for activating one or more transistor in the pull-up circuit can be determined against the first reference voltage. For a pull-down circuit, a second reference voltage can be set a resistance level of the pull-down circuit to a desired level. The resistance level of the pull-down circuit can be set to equal to the resistance level of the pull-up circuit. A second code can be set for activating one or more transistor in the pull-down circuit. The first and second reference voltages can be represented by index values. The code and second code can be stored for use by the pull-up circuit and pull-down circuit. Re-calibration of the pull-up and pull-down circuits can be performed to determine codes using the first and second reference voltages.

Techniques to calibrate an impedance level

Systems and methods are described for compensating for variations in process, voltage, temperature, or combinations thereof in an apparatus. An example apparatus may be a memory circuit. A pre-driver circuit and driver circuit may be associated with the memory circuit. A reference generator may provide the pre-driver circuit with reference signals that are insensitive to process, voltage, and temperature. The pre-driver circuit may receive the reference signals and the pre-driver circuit output ramping rate may then be made less sensitive to variations in process, voltage, and temperature. The pre-driver circuit output may then be supplied to a driver circuit that may then output a final driver data output with reduced noise.

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Shanghai, China

Jiawei Chen