Boe Technology Group Co., Ltd.

Beijing Zhongxiangying Technology Co., Ltd.

Microsoft Technology Licensing, LLC

Hefei Xinsheng Optoelectronics Technology Co., Ltd.

Jianmin Wu

Hong Wang

Haijin Wang

Yu Wang

Chuan Wang

Tian Lan

Jianfeng Zeng

Jianzhou Wang

Zheng Chen

Yu Feng

Fan Zhang

Jian-Tao Sun

Dong Chai

Decai He

Jian Hu

Jing Xue

Nan Liu

Haohan Wu

Yue Tang

Christoph Ponath

Fei Yuan

Qionghua Wang

Guoliang Shen

Ling Bao

Zhiming Tian

Minyang Deng

Jiawei Ren

Shaoqing Wu

Lijun Zeng

Yingli Zeng

Xieming Su

Guanchun Bai

Jifang Duan

The present disclosure provides a method for processing defect information of a product, which includes the following steps of: acquiring defect information on a current film layer and defect information on historical film layers; determining whether defect information exists at a target location of the historical film layer if defect information exists at a target location of the current film layer; if defect information exists for a corresponding location to the target location in at least one of the historical film layers, deleting the defect information detected at the target location in the current film layer; and if no defect information exists for the target location in any of the historical film layers, retaining the defect information detected at the target location in the current film layer. According to this, for the defect information on the current film layer, only the defect information caused by factors of the current film layer may be retained, and the defect information caused by the historical film layers will not be retained, and thus, on the one hand, the stored data volume may be reduced, and on the other hand, the complexity of subsequent analysis of defect information may be simplified.

Methods and devices for processing and retrieving defect information of product

A data processing method includes: obtaining a defect type of a sample set in response to a first input of a user on a first interface, the sample set including samples, each sample having a first parameter used to represent a defect degree of the sample with regard to the defect type and a second parameter used to represent device informations of sample production devices through which the sample passes; calculating yield purity indexes of sample production devices on the samples based on first parameters and second parameters of the samples, so as to obtain influencing parameters of the sample production devices, an influencing parameter of each sample production device being used to represent an influence degree to which the sample production device affects an occurrence of the defect type on the samples; and displaying the influencing parameters of the sample production devices on a second interface.

Data processing method, device and system, and electronic device

A data processing method is disclosed, the method comprising: after data synchronization, obtaining data offset of synchronous data related to a data integration task to be performed, the data offset representing deviation of the synchronous data from corresponding source data; determining whether the synchronous data is complete based on the data offset; in response to the synchronous data being complete, performing the data integration task to the synchronous data.

Data processing method and device for data integration, computing device and medium

A data management platform for intelligently managing data is provided. The data management platform includes an ETL module configured to extract, cleanse, transform, or load data; a data lake configured to store a first group of data formed by extracting raw data from a plurality of data sources by the ETL module; a data warehouse configured to store a second group of data formed by cleansing and standardizing on the first group of data; a general data layer configured to store a third group of data formed by subjecting the second group of data to data fusion; and a data mart configured to store a fourth group of data formed by transforming the third group of data by the ETL module. The general data layer is a distributed data storage storing information available for querying. The data mart is a database of NoSQL type storing information available for computational processing.

Data management platform, intelligent defect analysis system, intelligent defect analysis method, computer-program product, and method for defect analysis

A method for querying a product history is disclosed. The method includes receiving a product query request including at least one product query parameter for a target product to a product graph database that stores a relational map constructed based on a manufacturing process of the target product and describing entities including product entities and manufacturing entities and entity relations therebetween involved in the manufacturing process, querying the product graph database according to the product query parameter to obtain product history data of the target product by searching for a product entity corresponding to the target product as a target product entity in the relational map according to the parameter, searching for associated manufacturing entities of the target product entity according to the entity relations, obtaining the product history data based on the associated manufacturing entities, and sending a notification message to notify obtained product history data.

Method, system, device and medium for querying product history

A warehouse data processing system including a handheld terminal and a database server, wherein the handheld terminal is connected with the database server, the handheld terminal is used to scan goods information and/or stock location codes, acquire stock data including the goods information and/or the stock location codes from the database server, and perform warehouse data processing on the stock data according to the scanned goods information and/or stock location codes. The warehouse data processing is achieved in a mobile and portable manner by using the handheld terminal to scan goods information and/or stock location codes and performing warehouse data processing on the stock data according to the scanned goods information and/or stock location codes.

Warehouse data processing system and method

A method of ranking a plurality of products includes obtaining a numerical user score for each of the plurality of products, calculating an opinion score for each of the plurality of products for which a written comparison sentiment applies, determining a final score by combining the numerical user rating and the opinion score for each of the plurality of products, and ranking the plurality of products based on the final score. The opinion score is derived from one or more written comparison sentiments containing a first product name and a second product name. In another aspect, a computer readable medium has instructions stored thereon which, when executed, cause a computer to perform a method of ranking a plurality of products including at least a first product and a second product.

Ranking products by mining comparison sentiment

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Beijing, China

Jianmin Wu