Zhongpai S&t (shenzhen) Co., Ltd

Dongguan Songshan Lake Southern Medical University Sci. & Tech. Park Co., Ltd.

Jianfeng Xu

Qiyu Peng

Zhixiang Zhao

Qiu Huang

Han Shi

An apparatus, device and method for measuring a breakdown voltage are disclosed. The apparatus comprises a controlled voltage source (122), a current detection circuit (124), and a processing circuit (126). The controlled voltage source (122) is used for providing a series of test bias voltages for the sensor unit (110). The current detection circuit (124) is used for detecting a current signal output by the sensor unit (110) and generating a corresponding detection signal. The processing circuit (126) is used for controlling the controlled voltage source (122) to provide a series of test bias voltages, calculating dark currents respectively corresponding to the series of test bias voltages on the basis of the detection signal, and determining a breakdown voltage of the sensor unit (110) on the basis of the series of test bias voltages and the dark currents.

Apparatus, device and method for measuring breakdown voltage

An apparatus, device and method for measuring a gain of a sensor are disclosed. The apparatus comprises a current detection circuit () and a processing circuit (). An input end of the current detection circuit () is used for connecting to an output end of a sensor unit (). The current detection circuit () is used for detecting a current signal output by the sensor unit and generating a corresponding detection signal. An input end of the processing circuit () is connected to an output end of the current detection circuit (). The processing circuit () is used for calculating energy of dark events occurring in the sensor unit () according to the detection signal, generating an energy spectrogram of the dark event, and calculating a gain of the sensor unit () based on the energy spectrogram.

Apparatus, device and method for measuring gain of sensor

A support unit (), a support device () and an emission tomography device using the support device () are provided. The support unit () comprises: a support body (), in which an accommodation space () that penetrates through the support body is provided, comprising multiple support positions (A,B) that are distributed along a circumferential direction of the accommodation space (); and multiple fastening means (A,B), connected to at least some of the multiple support positions. At least some of the multiple fastening means (A,B) can move between a contraction position and an extension position along a radial direction of the accommodation space (). The fastening means (A,B) are used to fasten detectors of the emission tomography device. When the fastening means (A,B) are located at the contraction position, a first detector fastening ring of a first diameter is formed, and when the fastening means (A,B) are located at the extension position, a second detector fastening ring of a second diameter that is smaller than the first diameter is formed. The emission tomography device using the support unit () can adjust at least a radial length of a detection chamber, so that a relatively large three-dimensional space angle can be obtained, thereby improving detection sensitivity.

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Wuhan, China

Jianfeng Xu