University of Virginia Patent Foundation

Jian Xun Mou

Zhifeng Shao

Gang Huang

An atomic force microscope which can provide an automatic operation of focusing a laser beam onto a cantilever of the atomic force microscope, and which can ensure that a laser beam reflected off this cantilever is properly directed to a detector. A tip supported by the cantilever can also be automatically and properly lowered to a specimen. A piezotube scanner within such an atomic force microscope is also provided to prevent any damage from occurring if any leakage of an aqueous solution containing the specimen occurs.

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Charlottesville, VA, United States of America

Jian Xun Mou