Nankai University

Jia-Xin Chen

Jing-Jun Xu

Wei Wu

Meng-Xin Ren

Jun-Jun Ma

Wei Cai

A system for determining a second-order nonlinear susceptibility of a material includes a laser light source, a polarization modulator, a light collector, a polarization detector and a controller. The controller can obtain the second-order nonlinear susceptibility of the sample to be tested according to the test data. The system for determining the second-order nonlinear susceptibility of a material can directly test a material (block or film) with a thickness of hundreds of nanometers, and draw a second-order nonlinear susceptibility fitting curve of the material according to the test results of the optical system.

Growing community of inventors

Tianjin, China

Jia-Xin Chen