Hon Hai Precision Industry Co., Ltd.

Fu Tai Hua Industry (Shenzhen) Co., Ltd.

Jia-Hong Yang

Shih-Fang Wong

Xin Lu

Hui-Feng Liu

Peng Tang

Fei Wang

A method testing the quality of products applied to a system is provided. Each product includes a unique identification number. The system includes a data storage device and test devices. The data storage device includes a first table recording identification numbers, test types, and test results, each test device stores a second table records the identification numbers and the test types. The method includes: obtaining the identification number; obtaining the test type; determining whether a test type previous to the test type exists; and generating first information to prompt the operator to return the to-be-tested product to the workstation of previous test type when the test result corresponding to the existed previous test type does not exist or the test result corresponding to the existed previous test type is a first value.

Product line management system and method thereof

A process giving a client the capability of fixing the time within which it may attempt to connect itself to a standby server and a method thereof are provided. The client records the length of time preceding every successful-connection to at least one standby server within a predetermined period, determines an average connection setup time relating to the at least one standby server calculated from all the recorded connection setup times, detects in real time whether the client is successfully connected to a master server, and switches the connection attempts of the client away to each standby server in turn, according to the average connection setup time applying to each standby server respectively, once the client has lost its connection with the master server.

Client with standby server connection function and method thereof

An electronic device tester is connected to an electronic device needed to be tested. A test program is stored in a data storage of the tester. The test program includes a number of test instructions. The tester encapsulates the test instructions of the test program to a number of script files, stores the script files to the data storage, and records a name of each script file to the test program. After the test instruction is encapsulated, the tester selects desired script files of the test program and calls the selected script files according to the names of the script files to implement the test program to test the electronic device.

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Shenzhen, China

Jia-Hong Yang