Samsung Electronics Co., Ltd.

Ji-Young Shin

Jae-Moon Lee

Jae-Jun Kim

Yu-sin Yang

Tai Kyung Kim

Jaejun Kim

Byungkook Baek

Deoksang Yun

Jong-An Kim

Yoon-jung Choi

San-Hui Oh

Woo-Joo Choi

Sung-Jae Lee

Tai-Kyung Kim

Young-Nam Kim

Soo-Hyun Lee

Hyung-Suk Cho

Kyu-seok Kang

Hyun-joo Sim

Byung-Kook Baek

Ji-Hyeong Lee

Tae-Sung Kim

Chung-sam Jun

Tae-hyoung Cho

Moon-Shik Kang

Ji-Hye Kim

Sang-kil Lee

Chung-Sam Jun

Jae Jun Kim

Sungjae Lee

Woo-seok Ko

Eun-Kyung Hong

Heon Ho Jeong

Byung-Sug Lee

Seong-Jin Yun

Ki-Suk Chung

Joon-Seo Song

A rack assembly and a dishwasher having the same, the rack assembly includes a basket in which a plurality of holes are formed; and a loading plate that is disposed to be separable from the basket and to be deformable so that loading plate and the materials to be washed placed thereon are removable from the basket. Through this configuration, loading and unloading of the materials to be washed can be easily performed.

Rack assembly and dishwasher having the same

Example embodiments relate to an apparatus and method for inspecting a substrate defect. The substrate defect inspecting apparatus includes a substrate, a light source emitting an infrared beam to the substrate, a detector detecting the infrared beam reflected from the substrate, and a defect analyzer receiving first information and second information from the detector and analyzing defects existing in the substrate. According to at least one example embodiment, the second information is acquired during a later process than the first information.

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Seoul, South Korea

Ji-Young Shin