Shenzhen Futaihong Precision Industry Co., Ltd.

Fih (hong Kong) Limited

Fih (hing Kong) Limted

Ji-Wen Yang

Lei Li

Ping Chen

Zhi Feng Cheng

Chang-Fa Sun

Lin-Sen Dong

Yan-Xin Yu

Li-Ping Yang

Li Chang

A device for determining dimensions of a workpiece includes a locating apparatus, a determining apparatus and a main processor. The locating apparatus includes a locating board supporting workpieces and defining at least one detecting aperture therethrough. The determining apparatus includes a detecting module, the detecting module includes at least one laser detector, each laser detector includes a laser emitter and a laser receiver respectively mounted on two opposite sides of the locating board. The main processor is connected to the locating apparatus and the determining apparatus, the laser emitter emits laser beams traveling through the detecting aperture and received by the laser receiver, and the main processor determines the dimension of the workpiece according to the dimension of parts on the laser receiver shielded by the workpiece.

Device for determining dimension of a workpiece

A measuring system () for flatness degree measurement includes a measuring instrument () and a processing device (). The measuring instrument has a base (), a guide column (), a sliding member (), a digital micrometer () and a holding member (). The guide column is vertically attached to the base. The sliding member is moveably attached to the guide column. The digital micrometer is firmly fastened to the sliding member. The holding member is configured for fixing a workpiece () and has a reference-standard surface formed thereon. The processing device electronically connects with the digital micrometer. The processing device receives a plurality of measured values from the digital micrometer and displays a testing result after processing the measured values.

Micrometer-based measuring system and method of using same

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Shenzhen, China

Ji-Wen Yang