Samsung Electronics Co., Ltd.

Ji-Seong Doh

Jae Ho Kim

Song-Yi Han

Young Jun Cho

Jae Min Kim

Kang-hyun Baek

Seong Hun Jang

Young Kyou Shin

Yun Ji Choi

Sang-Hoon Lee

Yong Hee Park

Daewook Kim

Moon-hyun Yoo

Jong-bae Lee

Dae-wook Kim

A semiconductor design automation system comprises a simulator configured to generate simulation data, a recovery module configured to correct a sampling error of the simulation data to generate recovery simulation data, a hardware data module configured to generate real data, a preprocessing module configured to preprocess the real data to generate preprocessed real data, a database configured to store the recovery simulation data and the preprocessed real data, a first graphic user interface including an automatic simulation generator configured to generate a machine learning model of the recovery simulation data and the preprocessed real data and generate predicted real data therefrom, and a second graphic user interface including a visualization unit configured to generate a visualized virtualization process result from the machine learning model.

Semiconductor design automation system and computing system including the same

A product layout testing method includes testing and correcting one or more patterns of a product layout, detecting and correcting electrical characteristic changes of transistors of the product layout, and testing whether a product characteristic predicted from the product layout is equal to that predicted from a designed circuit view. Weak points with respect to the pattern may be detected and corrected, electrical characteristic changes depending on layout parameters may be detected and corrected, and whether a circuit operation depending on parasitic components is normal may be checked.

Layout testing method and wafer manufacturing method

A method for estimating statistical distribution characteristics of physical parameters of a semiconductor device includes manufacturing a plurality of semiconductor device chips, each having a plurality of transistors, preparing electrical characteristic data by measuring electrical characteristics of the plurality of transistors included in the plurality of chips, extracting an inter-chip distribution characteristic and an intra-chip distribution characteristic of the electrical characteristics by analyzing the electrical characteristic data, generating random number data satisfying the extracted inter-chip and intra-chip distribution characteristics, and performing a simulation for extracting statistical distribution characteristic data of the physical parameters of the chips, based on the random number data.

Methodology for estimating statistical distribution characteristics of physical parameters of semiconductor device

Growing community of inventors

Hwaseong-si, South Korea

Ji-Seong Doh