Hynix Semiconductor Inc.

Skhynix Inc.

Ji-Hyae Bae

Sang-Sik Yoon

Dong-Keun Kim

Ki-Chang Kwean

Kyoung-Wook Park

Sang-Sie Yoon

Min-Hye Lee

Yong-Ho Kim

Provided are, among others, memory circuits or devices and their applications in electronic devices or systems and various implementations of an electronic device which includes two variable resistance elements in each storage cell, thereby increasing margin and speed of a read operation. One disclosed electronic device includes a semiconductor memory unit which, in one implementation, in addition to two variable resistance elements, further includes a bit line and a bit line bar formed at a metal level; a first word line formed at a transistor level lower than the metal level, and extended in a direction perpendicular to the bit line or the bit line bar; a first selecting element formed at the transistor level and coupled to the bit line and the first word line; a second selecting element formed at the transistor level and coupled to the bit line bar and the first word line.

Electronic device having semiconductor memory comprising variable resistance elements for storing data

An electronic device comprising a semiconductor memory unit that may include a plurality of data transfer lines; a plurality of columns including a plurality of memory cells; at least one redundancy column including a plurality of redundancy memory cells and configured to replace at least one column among the plurality of columns; a repair select information generation unit configured to store a column address of the at least one column to be replaced among the plurality of columns and generate a plurality of repair select information in response to the stored column address; and a plurality of repair selection units connected with data transfer lines corresponding to them among the plurality of data transfer lines, columns corresponding to them among the plurality of columns and the at least one redundancy column, and each configured to electrically connect a column selected among a column corresponding to it and the at least one redundancy column, to a data transfer line corresponding to it, in response to repair select information corresponding to it among the plurality of repair select information.

Electronic device and method for operating electronic device

Semiconductor memory device with high-speed data transmission capability, system having the same includes a plurality of address input circuits and a plurality of data output circuits and a training driver configured to distribute address information input through the plurality of address input circuits together with a data loading signal for a read training, and generate data training patterns to be output through the plurality of data output circuits.

Semiconductor memory device with high-speed data transmission capability, system having the same, and method for operating the same

A semiconductor memory device includes: a data multiplexing unit configured to output one of a data training pattern and data transferred through a first global input/output line in response to a training control signal; and a latch unit configured to latch an output of the data multiplexing unit to apply and maintain the latched output to a second global input/output line.

Semiconductor memory device for transferring data at high speed

A nonvolatile memory device includes a selecting unit configured to select one of a read data or a program signal indicating a program period, an output unit configured to output an output signal of the selecting unit to the outside of a chip, and an output pin connected to the output unit.

Nonvolatile memory device and method for operating the same

A semiconductor memory device that may perform a second operation during a first operation comprises a command decoder for generating a decoded command signal, a suspend pulse and a resume pulse, and a storage unit for storing the decoded address signal, the decoded command signal and a data signal in response to the suspend pulse and providing the decoded address signal, the decoded command signal and the decoded data signal as a stored address signal, a stored command signal and a stored data signal, respectively, in response to the resume pulse.

Semiconductor memory device and method of operating the same

A data transfer circuit has a reduced number of lines for transferring a training pattern used in a read training for high speed operation, by removing a register for temporarily storing the training pattern, and a semiconductor memory device including the data transfer circuit. The data transfer circuit includes a latch unit and a buffer unit. The latch unit latches one bit of a training pattern data input together with a training pattern load command whenever the training pattern load command is input. The buffer unit loads a plurality of bits latched in the latch unit, including the one bit of training pattern data, in response to a strobe signal.

Data transfer circuit and semiconductor memory device including the same

A semiconductor memory device is capable of performing a stable high-speed operation while inputting/outputting data. The semiconductor memory device includes an inversion output circuit configured to output a clocking pattern in a clocking mode, and an inversion pin to which the inversion output circuit is connected.

Semiconductor memory device and method for operating the same

Semiconductor memory device

A semiconductor memory device includes training drivers configured to transmit one of data and a predetermined training data pattern from a first data lines to a second data lines in response to a training control signal which is produced by decoding a read training command; and the second data lines configured to transmit an output of the training drivers. The semiconductor memory device according to the present invention can exactly measure a delay time, which is changed according to the surrounding environments between a semiconductor memory device and a data processing unit, through a data training and operation timing can be also adjusted based on the measured delay time.

A semiconductor memory device and an operating method thereof prevent the mal-operation of the semiconductor memory device induced by misrecognizing addresses or data as commands. The semiconductor memory device includes a plurality of input pads, a data information path, a command path, a transfer block configured to transmit signals coupled through the input pads to the data information path and the command path, a command decoding block configured to decode signals transmitted through the command path to verify an inputting of a command, and a transmission control block configured to generate a control signal for controlling the signal transmission from the transfer block to the command path according to the verified result of the command decoding block.

Semiconductor memory device for preventing mal-operation induced by misrecognizing addresses/data as commands and operating method thereof

A data output circuit for a semiconductor memory apparatus includes a data output control unit that generates a selection signal, an output timing signal, and an input control signal in response to a read command and a clock, and a signal-responsive data output unit that receives parallel data in response to the input control signal, arranges the parallel data in response to the selection signal, and sequentially outputs the arranged parallel data as serial data in synchronization with the output timing signal.

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Icheon-si, South Korea

Ji-Hyae Bae