Korea Advanced Institute of Science and Technology

Samsung Electronics Co., Ltd.

Jhinhwan Lee

Insu Jeon

Hwansoo Suh

Donghyeon Son

An amplifier circuit and a method of recovering an input signal in the amplifier circuit are provided. The amplifier circuit may recover an input signal by using a time constant and an output signal of a signal amplifier which is delayed by a certain period, based on characteristics of an inverse Laplace transform of a transfer function of the signal amplifier. A time required for recovering the input signal may be shorter than the time constant of the signal amplifier.

Amplifier circuit and method of recovering input signal in the amplifier circuit

A piezoelectric actuator and a method of measuring a motion by using the piezoelectric actuator are provided. The piezoelectric actuator includes: a movable member that is disposed to face the fixed member; a piezoelectric element that is disposed between the fixed member and the movable member, and configured to operate in a shear mode based on input voltages applied to the piezoelectric element and move the movable member relative to the fixed member; and a position sensor that is disposed between the piezoelectric element and the movable member, and configured to measure a motion of the movable member.

Piezoelectric actuator and method of measuring motion by using the same

A transfer line includes a first conduit, a first insulation part, a first protective shield, a second conduit, a second insulation part and a second protective shield. Cryogenic liquid flows through the first conduit. The first insulation part surrounds the first conduit and has a multi-layered film structure. Film layers of the multi-layered film structure are spaced apart from each other. The first protective shield is formed with a predetermined thickness and diameter to surround the exterior of the first insulation part. Coolant for cooling the first protective shield flows through the second conduit. The second conduit is in contact with the first protective shield. The second insulation part surrounds the first protective shield and the second conduit, and has the multi-layered film structure. The second protective shield is formed with a predetermined thickness and diameter to surround the exterior of the second insulation part.

Transfer line for cryogenic liquid

Plural AFM probes with different resolutions are implemented on an apparatus for scanning a nearly free-standing nanometer-scale specimen. The apparatus identifies the location and the shape of the nano structure on a specimen piece using a high resolution AFM probe, and then measures a three-dimensional shape of the identified nano structure using an atomic resolution AFM probe.

Growing community of inventors

Daejeon, South Korea

Jhinhwan Lee