General Electric Company

Jerry A Thomas

John Eric Tkaczyk

Jeffrey Wayne Eberhard

Rowland F Saunders

John Patrick Kaufhold

John M Sandrik

Dinko Eduardo Gonzalez Trotter

Systems, methods and apparatus are provided through which, in some embodiments, an electronic sensor is positioned in the field of projection of an X-ray source, and the electronic sensor measures the deviation between a visible light field and an X-ray field. In some embodiments, the deviation is scaled in reference to the position of the electronic sensor between an X-ray receptor and the X-ray source.

Systems, methods and apparatus for determining deviation of an x-ray field, a light field and a primary receptor

A method for calibration of an imaging system includes providing a calibration phantom system including a first phantom element material block having a first surface at a first height, wherein the first phantom element material block at least partially includes a first material having a first attenuation coefficient. Providing a calibration phantom system also includes providing a second phantom element material block having a second surface at a second height different than the first height, the second phantom element material block at least partially including a second material having a second attenuation coefficient different than the first attenuation coefficient, wherein the first phantom element material block and said second phantom element material block are co-positioned on a detector. The method also includes imaging the calibration phantom system to obtain phantom images, processing the phantom images, and extracting a plurality of calibration values from the processed phantom images.

Method and apparatus for calibrating an imaging system

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Potomac, WI, United States of America

Jerry A Thomas