Texas Instruments Corporation

Cubicpv Inc.

Hee Solar, L.l.c.

Texas Tech University System

Electroglas, Inc.

Hunt Perovskite Technologies, L.l.c.

Jerome R Lovelace

Michael D Irwin

Kamil Mielczarek

A Kathleen Hennessey

YouLing Lin

Howard V Hastings, Ii

Ning San Chang

The performance of photosensitive devices over time may be tested by configuring a photosensitive device test system that includes a light source plate that exposes photosensitive devices within a container to a specified light intensity. The light intensity may be adjusted by a programmable power source according to one or more thresholds. A test may last for a set duration with performance measurements being taken at predetermined intervals throughout the duration. Feedback from the photosensitive device test system may be recorded to determine whether to increase light intensity, to stop testing, to continue testing, and whether one or more environmental conditions should be altered. Measurements may be sent to a client for analysis and display to a user.

System and method for testing photosensitive device degradation

A yield and failure analysis system having composite wafermaps provides the ability to view numerous lots on a single screen, identifying the semiconductor manufacturing process, which caused wafer failures and the associated malfunctioning equipment. A wafer inspection instrumentation ( ) probes each wafer within a given lot and applies a series of tests. Wafer defect data is stored in a first relational database ( ) for compiling a composite wafermap for each lot. Collected wafer defect data is converted into a FFT signature. Present wafer defect data is compared with stored converted wafer defect data patterns to generate correlation coefficients. When the correlation coefficients are within a predetermined range, the converted wafer defect data pattern is stored in the second relational database ( ). Data may be accessed from both databases by a user interface ( ), enabling the user to analyze data in real time and generate reports.

Method and apparatus for yield and failure analysis in the manufacturing of semiconductors

A method involves capturing visual indicia as a digital image, isolating the visual indicia on the digital image, converting the visual indicia to image primitives, identifying and presenting the visual indicia. An apparatus contains a camera for capturing a visual image, a video-to-digital converter, and a computer with a processor, appropriate memory, and software.

System and method for recognizing visual indicia

A method and apparatus for reading visual indicia is disclosed. The method involves capturing the visual indicia as a digital image, isolating the visual indicia on the digital image, converting the visual indicia to image primitives, identifying the identified visual indicia, and presenting the visual indicia. The apparatus contains a camera for capturing a visual image, a video-to-digital converter, and a computing means.

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Lubbock, TX, United States of America

Jerome R Lovelace