Westco Scientific Instruments, Inc.

Process Sensors Corporation

Other

Jerome J Workman, Jr

Thomas Andrew Bennett

Tushar Saraf

John H Coates

John Glaberson

David Naranjo

Aspects of spectrometer secondary reference calibration are described. In one embodiment, a diagnostic measurement for evaluation of an aspect of calibration in spectroscopy is performed. A result of the diagnostic measurement is analyzed to determine a deviation from an expected result. Based on the analysis, a correction algorithm may be applied to the aspect of calibration, in view of the deviation. In some embodiments, a product model diagnostic measurement is also performed for further evaluation of the aspect of calibration. A result of the product model diagnostic measurement is analyzed to determine a product model deviation from an expected result of the product model diagnostic measurement, and a product model correction algorithm is applied, if necessary. According to aspects of the embodiments described herein, using secondary reference standards permits reconstruction of calibration parameters without any need for a master instrument or other forms of calibrated reference instrumentation.

Spectrometer secondary reference calibration

Various embodiments of a dark reference standard for an instrument are described. In one embodiment, the dark reference standard includes a sample cup and an arrangement of dark reference standard materials. The arrangement of dark reference standard materials can be embodied as a dark glass, such as a welding glass, and a polymer film such as a carbon black or carbon black master polymer film.

Dark reference standard and measurement thereof

Aspects of a micromirror spectrophotometer assembly are described. In one example case, an instrument includes a diffraction grating to disperse broadband light over a range of wavelengths, a detector, a digital micromirror device (DMD) configured to scan through and reflect at least a portion of the range of wavelengths toward the detector, and a base platform having a number of integrally formed assembly mounts. The assembly mounts are formed to align and secure the diffraction grating, the detector, the DMD, and other optical components of the instrument in a predetermined arrangement. The instrument can also include a reference paddle having a reference material for calibration of the instrument, and a rotatable sample tray to rotate a sample placed on the sample tray for measurement.

Micromirror spectrophotometer assembly

Aspects of blending data detected by a monochromator over multiple wavelength ranges is described herein. In one embodiment, the monochromator includes a diffraction grating, a grating drive motor that rotates the diffraction grating to provide, by diffraction of broadband light, first dispersed wavelengths of light and second dispersed wavelengths of light, a detector that detects a first reflection from the first dispersed wavelengths of light and a second reflection from the second dispersed wavelengths of light, and processing circuitry that blends data values from the first reflection and data values from the second reflection together to provide a spectrum of combined data values. By blending data detected over multiple ranges, measurements of relatively high precision and quality can be provided over a wider spectral range.

Data blending multiple dispersive range monochromator

Aspects of a monochromator are described herein. In one embodiment, the monochromator includes a light source that provides light, a diffraction grating including a first diffraction grating and a second diffraction grating, a grating drive motor that rotates the diffraction grating to provide dispersed wavelengths of light, a detector that detects a portion of the dispersed wavelengths of light, and processing circuitry that controls a grating drive motor to regulate an angular velocity of the grating based on an angular orientation of the diffraction grating. By using a diffraction grating having multiple, different dispersive surfaces, measurements of relatively high precision and quality may be taken throughout a wider spectral range. In another aspect, the processing circuitry controls a sample drive motor to vary an angle of incidence of the dispersed wavelengths of light onto a sample for evaluation.

Tandem dispersive range monochromator

Aspects of a tandem dispersive range monochromator and data knitting for the monochromator are described herein. In one embodiment, the monochromator includes a tandem diffraction grating, a grating drive motor that rotates the tandem diffraction grating to provide, by diffraction of broadband light, first dispersed wavelengths of light and second dispersed wavelengths of light, a detector that detects a first reflection from the first dispersed wavelengths of light and a second reflection from the second dispersed wavelengths of light, and processing circuitry that knits together data values from the first reflection and data values from the second reflection to provide a spectrum of combined data values. By using a tandem diffraction grating having different dispersive surfaces, measurements of relatively high precision and quality may be taken throughout a wider spectral range, and the measurements may be knitted together to provide a spectrum of combined data values.

Data knitting tandem dispersive range monochromator

Aspects of a tandem dispersive range monochromator are described herein. In one embodiment, the monochromator includes a light source that provides broadband light, a tandem diffraction grating including a first diffraction grating and a second diffraction grating, a grating drive motor that rotates the tandem diffraction grating to provide dispersed wavelengths of light, a detector that detects a portion of the dispersed wavelengths of light, and processing circuitry that controls a grating drive motor to regulate an angular velocity of the tandem grating based on an angular orientation of the tandem diffraction grating. By using a tandem diffraction grating having different dispersive surfaces, measurements of relatively high precision and quality may be taken throughout a wider spectral range. In another aspect, the processing circuitry controls a sample drive motor to vary an angle of incidence of the dispersed wavelengths of light onto a sample for evaluation.

Growing community of inventors

Danbury, CT, United States of America

Jerome J Workman, Jr