Eastman-kodak Company

Jerold B Lisson

Darryl I Mounts

Dale K Mack

Richard A Stark

Thomas W Dey

Kenneth L Mason

Victor L Genberg

Norbert William Zoltowski

Apparatus for calibrating a linear image sensor, includes a fluorescent light source, at least as long as the image sensor; a fixture for holding the light source parallel to the image sensor and displaced from the image sensor by a fraction of the length of the image sensor; and a light level controller for producing a plurality of light levels from the lamp.

Apparatus for calibrating a linear image sensor

A focus sensor for detecting the focus state of an image forming optical system relative to an object, the optical system having a plane of best imaging focus, includes: a plurality of image detectors located at a corresponding plurality of positions relative to the plane of best imaging focus for producing a respective plurality of image signals; and a signal processor connected to the image detectors for determining a position of best focus by calculating the covariances between respective pairs of the image signals.

Covariance focus sensor

An improved auto focus system particularly adapted for use in a camera for automatic focus control of a camera taking lens having first and second linear arrays of photosensitive elements spaced apart laterally from one another and spaced apart in separate planes and first and second lenslets for imaging the scene to be photographed thereon. The system functions by autocorrelation of first and second signals output from the first and second linear arrays, employing parallax range derivation from the first and second signals to derive a motor drive signal, applying the motor drive signal to the taking lens focus adjustment mechanism to adjust the taking lens, employing contrast derivation from the first and second signals during adjustment of the taking lens, and halting adjustment of the taking lens when a position of best focus is indicated by the contrast derivation.

Direct focus feedback autofocus system

A method for assessing and correcting individual components of a non-monolithic imaging assembly. The method has an advantage of expanding an applicability of a classical optical transfer function, heretofore a measure only of a global monolithic imaging device performance, so that it can provide information for correcting the non-monolithic imaging assembly in terms of local area modifications.

Method for assessing and correcting individual components of a

A method for assessing and correcting via feedback, the optical quality of an imaging device. The method has an advantage of expanding the applicability of a classical optical transfer function, heretofore a measure only of global imaging device performance, so that it can provide feedback information for correcting an imaging device defect in terms of local area modifications. In a optical system which comprises a source of radiation that can output a radiation beam and an imaging device to be corrected and which can image the radiation beam to produce an imaged beam, the method comprises the steps of (1) sampling the imaged beam by an opaque mask defining at least two apertures, for generating local wavefront errors at a pupil position defined by a location of the mask, (2) computing a localized optical transfer function (LOTF) for the localized wavefront errors transmitted through the sampling apertures, the LOTF being defined by an equation relating it to a local modulation transfer function (LMTF) and a local phase transfer function (LPTF), (3) generating from the LOTF a performance map comprising a local optical quality factor (LOQF) comprising the ratio of computed LMTF to a diffraction limited LMTF and the LPTF, and (4) generating from the performance map correction feedback for applying a controlled action to the imaging device.

Method for providing feedback correction for an imaging device

A method for testing or controlling a performance of an adaptive optic. The method includes the steps of generating from the adaptive optic an augmented matrix comprising a local wavefront difference-error sensitivity matrix; and, a local optical quality factor sensitivity matrix; interrogating the adaptive optic by preferentially turning on selected laser sources which are directed into an entrance pupil of the adaptive optic, for recording a resultant diffraction pattern at an imaging plane; taking a Fourier transform of the resultant diffraction pattern, for generating magnitude and phase component at selected pupil positions; laser scanning the entrance pupil of the adaptive optic, for generating up to N samples of magnitude and phase components, thereby forming an observation vector; and solving for a force vector, for applying the force vector to the adaptive optic.

Method for testing or controlling a performance of an adaptive optic

A method for assessing the optical quality of an imaging device. The method is suitable for use in an optical system comprising a source of radiation that can output a radiation beam; and, an imaging device to be tested, which imaging device can image the radiation beam to produce an imaged beam. The steps of the method comprise: sampling the imaged beam by an opaque mask defining at least two apertures, for generating local wavefront errors at a pupil position defined by a location of the mask; and, computing an optical transfer function (OTF) for the localized wavefront errors transmitted through the sampling apertures. The method has an advantage of expanding the applicability of the optical transfer function, heretofore a measure only of global imaging device performance, so that it can provide information for correcting an imaging device defect in terms of local area modifications.

Method for assessing the optical quality of an imaging device

An assembly and method for monitoring the alignment of a workpiece with respect to a reference. The assembly and method employ an element which preferably comprises a capability for optical phase conjugation. Advantage which can result from the use of the element include enhanced sensitivity to alignment variations for both large and very small angle deviations from the reference.

Assembly and method for monitoring the alignment of a workpiece

A non-linear optical assembly for creating a synthetic aperture. The assembly includes an external source of radiation; at least two discrete non-linear elements, each of which elements has a defined aperture for receiving radiation outputted by the source; and an optical feedback means in operative association with the non-linear elements, for optically self-coupling the elements so that the elements collectively define a synthetic aperture that is greater than the defined aperture for any single element.

Optical assembly for creating a synthetic aperture

An assembly and method for monitoring the alignment of a workpiece with respect to a reference. The assembly and method employ an element which preferably comprises a capability for optical phase conjugation. Advantages which can result from the use of the element include enhanced sensitivity to alignment variations for both large and very small angle deviations from the reference.

Monitoring alignment of an element(s) is accomplished with a source of radiation (11), an alignment reflecting assembly (12) embedded within or attached to an element (13) whose alignment is to be monitored and a detection assembly (14). Alignment reflecting assembly (12) includes a conventional mirror (16) that reflects a portion of the incident radiation (E) at a reflection angle that is substantially equal in magnitude and opposite in sign to that of the angle at which the incident radiation is incident thereupon. Alignment reflecting assembly (12) also includes a phase conjugate mirror (18) that reflects incident radiation (E) at a reflection angle that is substantially equal in magnitude and sign to that of the angle at which the incident radiation is incident thereupon, i.e., along the path of the incident radiation. The alignment orientation of alignment reflecting assembly (12) and element (13) is determined by monitoring the so-called retro-reflected radiation from the phase conjugate mirror (18) and the reflected radiation from the conventional mirror (16).

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Henrietta, NY, United States of America

Jerold B Lisson