Qorvo Us, Inc.

St-ericsson Sa

Jeroen Kuenen

Achraf Dhayni

Hendrik Arend Visser

Alexandru Aurelian Ciubotaru

Anton Willem Roodnat

Dan Laurentiu Zupcau

Vikram Chaturvedi

Toby Balsom

Rob Kopmeiners

An on-chip capacitance measurement method and associated systems and devices are provided. Embodiments described herein rely on using the capacitor under test in an on-chip relaxation oscillator configuration whose charging/discharging currents, supply voltage, and output frequency are measured individually in a measurement block. The voltage thresholds of the relaxation oscillation are calculated from the circuit elements and the measured supply voltage. Because the oscillation frequency of the relaxation oscillator is a function of the capacitance under test, the charging/discharging currents, and the supply voltage (via voltage thresholds), the capacitance under test can be calculated using the measured values of the other quantities. Embodiments described herein provide an accurate, low-power, small-area on-chip system capable of measuring capacitance with high accuracy. An algorithm employing the above method and apparatus for tuning a crystal oscillator is also provided. Relevant circuit implementations used in the on-chip measurement system are also disclosed.

On-chip capacitance measurement method and apparatus

The present disclosure describes a system-on-chip (SoC) including a built-in self-test (BIST) block, a low-dropout (LDO) voltage regulator with a pass metal-oxide-semiconductor field-effect transistor (MOSFET), and a current-monitor circuit with a sensing MOSFET, a tuning MOSFET, a sensing resistor, and a tuning resistor. Herein, both the pass MOSFET and the sensing MOSFET receive an input voltage, and a gate of the pass MOSFET is coupled to a gate of the sensing MOSFET. The sensing MOSFET, the tuning MOSFET, and the sensing resistor are connected in series between the input voltage and ground, and the tuning resistor is coupled between a gate of the tuning MOSFET and ground. The BIST block is configured to tune a current through the tuning resistor so as to adjust a voltage at a connection point of the sensing MOSFET and the tuning MOSFET.

Current-monitor circuit for voltage regulator in system-on-chip

The present disclosure relates to a ring-oscillator with glitch-free frequency-tuning. The disclosed ring-oscillator at least includes multiple delay stages coupled in series within a ring loop and having a first delay stage, a capacitor bank coupled between an output of the first delay stage and ground, and a timing block configured to receive an output signal of the first delay stage and at least one controlling signal. The at least one controlling signal determines at least one capacitor in the capacitor bank connecting or disconnecting to the ring loop. The timing block is configured to pass or not pass the at least one controlling signal to the capacitor bank based on whether the output signal of the first delay stage meets a certain condition. Therefore, the connection or disconnection of the at least one capacitor does not cause a significant voltage change at the output of the first delay stage.

Glitch-free frequency tuning of ring-oscillators

A built-in receiver self-test system provides on-chip testing with minimal change to the receiver footprint. The system digitally generates a two-tone test signal, and tests the nonlinearities of the receiver using the generated two-tone test signal. To that end, the self-test system comprises a stimulus generator, a downconverter, and a demodulator, all of which are disposed on a common receiver chip. The stimulus generator generates a test signal comprising first and second tones at respective first and second frequencies, where the first and second frequencies are spaced by an offset frequency, and where the first frequency comprises a non-integer multiple of the offset frequency. The downcoverter downconverts the test signal to generate an In-phase component and a Quadrature component. The demodulator measures an amplitude of the intermodulation tone by demodulating the In-phase and Quadrature components based on a reference frequency.

Fully-digital BIST for RF receivers

Systems provide for a test system for capacitors in a digitally controllable oscillator (DCO). The system includes: capacitor toggling logic configured to switch on and off a selected one of the capacitors at a modulation frequency; a tone generator configured to generate a tone; a mixer configured to receive the tone and an output carrier signal from the DCO while the capacitor toggling logic is switching the selected one of the capacitors on and off and to output an intermediate frequency signal having FM sidebands based on the modulation frequency and relative capacitor size; and an evaluation circuit configured to evaluate a frequency deviation associated with the selected one of the capacitors based on at least one of the FM sidebands.

Methods and systems for production testing of DCO capacitors

A communication system includes a RF subsystem that communicates with a BB subsystem through a digital RF-BB interface multiplexing I/Q data and control signals in both TX and RX directions. The RF subsystem includes a FIFO buffer in each respective TX and RX chain and a timer that assigns a timestamp to the continuous stream in both TX and RX chains whenever it is equal to a time event from the BB subsystem. The BB subsystem includes a sample counter that counts the number (k) of data samples at the FIFO buffer and a controller that defines the time event. Precise alignment at the air interface between a data burst from the RF subsystem and a data burst from the BB subsystem can be achieved using the timer, based on the relation between the timer value (n) and the sample count (k).

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Beuningen, Netherlands

Jeroen Kuenen