Sony Semiconductor Solutions Corporation

Jeroen Hermans

Victor Belokonskiy

Günter Troll

Serge Hustin

Maksym Sladkov

Fabian Krome

An electronic device comprising circuitry configured to sample, in a calibration phase using a known time-of-flight &#x3c4;, a first set of differential mode measurements &#x3bc;(n&#x394;&#x3c4;,&#x3c4;) according to a first sampling strategy t, and to determine Fourier coefficients Mof the first set of differential mode measurements &#x3bc;(&#x3c4;,&#x3c4;) based on the known time-of-flight (&#x3c4;) used in the calibration phase, and to determine a cyclic error (f(&#x3b8;(&#x3c4;);x)) based on the Fourier coefficients (M).

Electronic device, method and computer program

A device includes a circuitry which has an image sensor with a plurality of pixels, wherein the circuitry obtains a differential mode for a quad of each pixel from the plurality of pixels of the image sensor, being representative of a depth information; obtains a first input based on a common mode signal for the quad of the pixel, being representative of an intensity of ambient light; obtains a second input being representative of a background light rejection ratio of the pixel; and estimates a phase for the pixel from the plurality of pixels of the image sensor based on the differential mode, the first input and the second input.

Device and method to estimate a phase for the quad of a pixel from an image sensor

An imaging apparatus includes a circuitry configured to perform depth analysis of a scene by time-of-flight imaging and to perform motion analysis in the scene by structured light imaging, wherein identical sensor data is used for both, the depth analysis and the motion analysis.

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Stuttgart, Germany

Jeroen Hermans