Basf Plant Science Company Gmbh

Jeroen Baert

Frederik Leyns

Pierre Lejeune

Joris Eeckhout

Fabio Fiorani

Cédrick Vandaele

Cádrick Vandaele

The invention relates to a method and apparatus for measuring inflorescence, seed and/or seed yield pheno-type of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of inflorescence, seed and/or seed yield phenotype of a panicle-like bearing plant.

Method and apparatus for measuring inflorescence, seed and/or seed yield phenotype

The invention relates to a method and apparatus for measuring inflorescence, seed and/or seed yield phenotype of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of inflorescence, seed and/or seed yield phenotype of a panicle-like bearing plant.

A screening device () for screening at least one plant specimen () in a plurality of plant specimens () is disclosed. The screening device () comprises a detector () adapted for acquiring spatially resolved images (). The screening device () further comprises at least one selection device () adapted for selecting a single plant specimen () or a group of plant specimens () from the plurality of plant specimens () for imaging by the detector (). The selection device () comprises a deflection device () adapted for deflecting electromagnetic waves propagating between the plant specimens () and the detector ().

Growing community of inventors

Erpe-Mere, Belgium

Jeroen Baert