Analog Devices,inc.

Analog Devices International Unlimited Company

Analog Devices Global

Analog Devices Global Unlimited Company

Jeremy Richard Gorbold

Gavin Patrick Cosgrave

Michael C W Coln

Colin Charles Price

Srikanth Aruna Nittala

Mahesh Madhavan Kumbaranthodiyil

Katherine O'Riordan

James Stegen

Mahesh K Madhavan

Tadhg Creedon

Robert Guyol

Andreas Callanan

Christian Steffen Birk

Colin S McIntosh

John R Reidy

Robert Parle

Gerard Mora Puchalt

Gautham Lakkur

Paul Joseph Maher

James Gibbons

John Morrissey

Niall McDermott

A status of one or more components of a battery monitor circuit can be evaluated, such as to validate operation of the monitor circuit. In an example, a battery monitor circuit can be evaluated by providing a first test signal to a battery voltage measurement circuit that is coupled to a battery. A first analog-to-digital converter (ADC) circuit can be configured to receive a first voltage signal from the battery voltage measurement circuit in response to the first test signal. A processor circuit can be configured to validate the first ADC circuit by evaluating a correspondence between the first test signal and the received first voltage signal. One or more other ADC circuits in the battery monitor circuit can be validated by cross-checking measurement results with information from the first ADC circuit.

Battery SOH determination circuit

A magnetic angle measurement system having magnetic angle sensors, signal processing circuitry and a processor is disclosed. First signal processing circuitry receives a first subset of outputs of a first plurality of outputs from a first magnetic angle sensor and determines first magnetic angle data based on the received first subset of outputs. Second signal processing circuitry receives a second subset of the outputs from the first magnetic angle sensor and determines second magnetic angle data based on the received second subset of outputs. Third signal processing circuitry receives a second plurality of outputs from the second magnetic sensor and determines third magnetic angle data based on the received second plurality of outputs. The processor compares the magnetic angle data and determines a processing result based on the comparison, where fault tolerance resolution of the magnetic angle measurement system is based at least in part on the processing result.

Apparatus for detecting sensor error

A serial interface, such as a serial peripheral interface (SPI), with improved diagnostic coverage is disclosed. The serial interface includes a data verification module that selects an error detection value in response to a mode signal indicating if the transmitting device is in user mode or test mode. For example, the data verification module computes a cyclic redundancy check (CRC) value and selects either the computed CRC value or its inverse based on the mode. The receiving device can determine the mode of the transmitting device based on the error detection value used. The serial interface further includes a read detector for clearing the transmit data buffer after data is read out. The serial interface may further include a loopback circuit for verifying that the data output from an output pin matches the data from the transmit data buffer.

Serial interface with improved diagnostic coverage

Systems and methods for detecting magnetic turn counter errors with redundancy are provided. In one aspect, a magnetic field turn sensor system includes a magnetic field angle sensor having a sine bridge and a cosine bridge and first to third comparators configured to compare the outputs from the sine and cosine bridges. The system further includes a processor configured to receive outputs from each of the first to third comparators, determine that a combination of the outputs from the first to third comparators corresponds to an invalid state, and indicate a fault in response to determining that the combination of the outputs from the first to third comparators corresponds to the invalid state.

Systems and methods for detecting magnetic turn counter errors with redundancy

Systems and methods for detecting magnetic turn counter errors are provided herein. In one aspect, there is provided a magnetic field turn sensor system including: a magnetic field angle sensor, a signal processing path configured to receive an output from the magnetic field angle sensor and generate an angle measurement based on the output, a turn count path configured to process the output from the magnetic field angle sensor and output a quadrant measurement based on the output and a processor. The processor is configured to: receive the angle measurement from the signal processing path and the quadrant measurement from the turn count path, determine that the angle measurement deviates from the expected transition angle by more than a threshold value, and indicate a fault in response to determining that the angle measurement deviates from the expected transition angle by more than the threshold value.

Systems and methods for detecting magnetic turn counter errors

An example method to reduce data handling on lithium ion battery monitors is provided and includes receiving a request from a micro-controller for data associated with one or more cells, receiving signals corresponding to monitored properties from the cells, calculating derivative properties from the monitored properties, dividing a default data into a plurality of portions, and sending the derivative properties and one of the portions to the micro-controller according to at least a first compute logic option or a second compute logic option. The default data can include cell voltages, auxiliary inputs, stack voltage, reference output voltage, analog voltage output, analog voltage input, temperature, and reference buffer voltage. The default data is provided sequentially to the micro-controller in as many consecutive read backs as the number of portions, where each portion corresponds to the default data measured at a distinct time instant.

System and method to reduce data handling on lithium ion battery monitors

An analog multiplexer may be used for sampling an input voltage that is capable of having a higher voltage level than an upper supply voltage. The analog multiplexer includes a plurality of input switch circuits and a shorting switch circuit. The plurality of input switch circuits include n-type or p-type laterally diffused field effect transistors (NLDFETs or PLDFETs). At least one of the input switch circuits includes a level shifting switch circuit that is able to sample an input voltage that is greater than the upper supply voltage for the multiplexer. A shorting switch circuit, at an output of the multiplexer, includes a capacitively coupled gate drive circuit and is configured to short a first differential output to a second differential output after the input voltage is sampled.

Analog multiplexer

A battery monitoring system and method are disclosed. A battery monitor compares data in parallel register files. If voltage deviation above a certain threshold is detected in one register file, the system generates an alert that a fault exists upstream in the system. In order to better detect errors, the system may intentionally alter the voltages on the batteries to be monitored.

Channel verification of multiple channels on one chip

Methods and apparatus to reduce localized transistor operating temperature increases in fully integrated voltage regulator circuits are provided. Transistor self-heating effects are reduced by dispersing heat more evenly over the integrated circuit die, via use of nested voltage regulator circuits and/or use of more than one transistor in a voltage regulator circuit pass device. An electrically parallel-connected group of multiple individual integrated transistors may be laid out across cooler areas of the integrated circuit die, such as in substantially linear sets or rings of devices near the outer die perimeter. Each transistor in the group may better disperse its own heat if it is thermally segregated from other self-heating devices, as through a minimum physical layout spacing. Transistor bias voltage mismatch tolerances, load currents, and routing resistances may interrelatedly determine the number of individual transistors needed in a group.

Reducing voltage regulator transistor operating temperatures

An exemplary method and system of addressing an integrated circuit within a daisy chain network. In the exemplary method, the address of the integrated circuit may be initialized to a predetermined initial address. The integrated circuit may receive a command that includes a type identifier and an address field. Based on the type identifier, the type of command may be determined. As a result of the determination, reading the address from the address field. The read address may be stored in a register. The address may be modified, and may be output. Upon receipt of the data or a command, the integrity of the data including data within the received command, may be confirmed by an error checking algorithm.

Addressable integrated circuit and method thereof

A redundant analog-to-digital conversion system can include at least one input multiplexer, first and second redundant analog-to-digital converters, a comparison circuit and an output multiplexer. The at least one input multiplexer can receive a plurality of analog input signals and output at lest one multiplexed analog input signal. The first and second redundant analog-to-digital converters can convert the at least one multiplexed analog input signal to respectively generate first and second digital output signals, the first digital output having a greater digital resolution than the second digital output. The comparison circuit can produce a comparison output signal as a function of a comparison of a plurality of most significant corresponding bit pairs of the first and second digital output signals. The output multiplexer can produce a multiplexed output including information from the comparison output signal and one of the digital output signals.

Test circuits and methods for redundant electronic systems

Embodiments of the present invention provide a monitoring system that may include a plurality of monitors. Each may have a plurality of input pairs coupled to respective components of a component stack, wherein adjacent monitors each have an input pair coupled to a common component. Embodiments of the present invention provide an integrated circuit that may include a plurality of detectors to locally measure a first group of channels. The integrated circuit may also include a receiver operable to receive a measurement of at least one channel of the first group of channels, and a controller to calculate a correction factor based on the received measurement and a local measurement of the at least one channel and to correct all first group measurements with the correction factor.

Accuracy of battery monitor parts

A battery monitor for monitoring the performance of at least one battery within an array of batteries, comprising: a data acquisition device for measuring at least one parameter of the at least one battery associated with the battery monitor, a first data interface operable to exchange data with a first device, and a second data interface operable to exchange data with a second device.

Battery montoring apparatus and daisy chain interface suitable for use in a battery monitoring apparatus

The analog-to-digital for converter (ADC) for converting an analog value into a digital equivalent using a parallel digital data path is disclosed. In one example embodiment, the ADC includes a switched capacitor DAC having an input to receive an analog value via analog sample and hold circuit. A comparator is coupled to the switched capacitor DAC. A successive approximation register (SAR) is coupled to the comparator. A plurality of logic blocks is coupled to the SAR. A plurality of thermometric encoders is coupled to the associated plurality of logic blocks. A plurality of MUXs is coupled to the associated plurality of thermometric encoders and the comparator, wherein the plurality of MUXs having associated outputs that is coupled to the input of the switched capacitor DAC.

Growing community of inventors

Newbury, United Kingdom

Jeremy Richard Gorbold