Growing community of inventors

Lincoln, NE, United States of America

Jeremy A Van Derslice

Average Co-Inventor Count = 2.62

ph-index = 1

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 4

Jeremy A Van DersliceMartin M Liphardt (5 patents)Jeremy A Van DersliceCraig M Herzinger (3 patents)Jeremy A Van DersliceJeffrey S Hale (3 patents)Jeremy A Van DersliceStefan Schoeche (3 patents)Jeremy A Van DersliceGriffin A P Hovorka (2 patents)Jeremy A Van DerslicePing He (1 patent)Jeremy A Van DersliceJohn A Woollam (1 patent)Jeremy A Van DersliceJames D Welch (1 patent)Jeremy A Van DersliceThomas E Tiwald (1 patent)Jeremy A Van DersliceChristopher A Goeden (16 patents)Jeremy A Van DersliceDuane E Meyer (1 patent)Jeremy A Van DersliceBrian D Guenther (1 patent)Jeremy A Van DersliceJeremy A Van Derslice (9 patents)Martin M LiphardtMartin M Liphardt (121 patents)Craig M HerzingerCraig M Herzinger (88 patents)Jeffrey S HaleJeffrey S Hale (34 patents)Stefan SchoecheStefan Schoeche (9 patents)Griffin A P HovorkaGriffin A P Hovorka (3 patents)Ping HePing He (78 patents)John A WoollamJohn A Woollam (61 patents)James D WelchJames D Welch (53 patents)Thomas E TiwaldThomas E Tiwald (21 patents)Christopher A GoedenChristopher A Goeden (16 patents)Duane E MeyerDuane E Meyer (10 patents)Brian D GuentherBrian D Guenther (8 patents)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. J.a. Woollam Co. (8 from 210 patents)

2. J.a. Woqllam Co., Inc. (1 from 1 patent)

3. Van Derslice, Jeremy, A. (0 patent)

4. Goeden, Christopher, A. (0 patent)

5. Liphardt, Martin M. (0 patent)


9 patents:

1. 11675208 - Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a super continuum laser source of a beam of electromagnetism, and improved detector system

2. 11391666 - Snapshot ellipsometer

3. 11035729 - Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a super continuum laser source of a beam of electromagnetism, and improved detector system

4. 10634607 - Snapshot ellipsometer

5. 10422739 - Reflectometer, spectrophotometer, ellipsometer and polarimeter systems with a super continuum laser source of a beam of electromagnetism, and improved detector system

6. 10175160 - Method to analyze spectroscopic ellipsometry or intensity data of porous samples utilizing the anisotropic bruggeman-effective medium theory

7. 10132684 - Reflectometer, spectrophometer, ellipsometer and polarimeter system with a super continuum laser-source of a beam of electromagnetism and improved detector system

8. 9976902 - Method to analyze spectroscopic ellipsometry data of porous samples utilizing the anisotropic Bruggeman-effective medium theory

9. 9599569 - Method to enhance sensitivity to surface normal optical functions of anisotropic films using attenuated total reflection

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12/12/2025
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