Samsung Display Co., Ltd.

Jeongmoon Lee

Daehong Kim

Hyungjin Lee

An inspection method for a display device includes radiating a first light including a light of a radiation wavelength range to a first dam region located in a non-display region of the display device located outside a display region of the display device, receiving a second light reflected from the first dam region, and analyzing the radiation wavelength range of the second light to inspect an organic encapsulation layer remaining in the first dam region after etching the organic encapsulation layer.

Inspection method for display device

A display device includes a display area including a light emitting element and an organic insulating layer on the light emitting element; and a non-display area adjacent to the display area in a first direction, the non-display area including a first dam spaced apart from the organic insulating layer in the first direction, and a first groove between the organic insulating layer and the first dam in the first direction.

Display device including dam and groove structure in non-display area

A display device including: a substrate; a display element layer disposed on the substrate; a dam disposed around the display element layer; a plurality of patterns disposed between the dam and the display element layer, and a planarization layer disposed on the display element layer and the patterns, wherein the patterns have a hydrophile-lipophile balance value different from a hydrophile-lipophile balance value of the planarization layer.

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Seoul, South Korea

Jeongmoon Lee